scholarly journals Voltage Rollercoaster Filtering of Low-Mass Contaminants During Native Protein Analysis

2020 ◽  
Vol 31 (3) ◽  
pp. 763-767 ◽  
Author(s):  
John P. McGee ◽  
Rafael D. Melani ◽  
Michael Goodwin ◽  
Graeme McAlister ◽  
Romain Huguet ◽  
...  
Keyword(s):  
Protein Analysis ◽  
Native Protein ◽  
Low Mass

Native Protein Analysis on TIMSTOF Pro mass spectrometer v2

2021 ◽  
Author(s):  
David Roberts
Keyword(s):  
Mass Spectrometer ◽  
Protein Analysis ◽  
Native Protein

Method described in David Robert et al., https://pubs.acs.org/doi/10.1021/jacs.1c02713

Iron K-Line Emission from X-Ray Binaries

1988 ◽  
Vol 102 ◽  
pp. 47-50
Author(s):  
K. Masai ◽  
S. Hayakawa ◽  
F. Nagase
Keyword(s):  
Accretion Disk ◽  
Radiative Recombination ◽  
Characteristic Temperature ◽  
Line Emission ◽  
Ionization Front ◽  
Continuum Radiation ◽  
X Ray ◽  
Low Mass ◽  
X Ray Binaries

AbstractEmission mechanisms of the iron Kα-lines in X-ray binaries are discussed in relation with the characteristic temperature Txof continuum radiation thereof. The 6.7 keV line is ascribed to radiative recombination followed by cascades in a corona of ∼ 100 eV formed above the accretion disk. This mechanism is attained for Tx≲ 10 keV as observed for low mass X-ray binaries. The 6.4 keV line observed for binary X-ray pulsars with Tx> 10 keV is likely due to fluorescence outside the He II ionization front.

Protein analysis of pediatric parapneumonic pleural effusion after intrapleural urokinase treatment

2010 ◽  
Vol 34 (8) ◽  
pp. S69-S69
Author(s):  
Jieh‑Neng Wang ◽  
Pao‑Chi Liao ◽  
Yu‑Chin Tasi ◽  
Jing‑Ming Wu
Keyword(s):  
Pleural Effusion ◽  
Protein Analysis ◽  
Parapneumonic Pleural Effusion

Genetic diversity of durum wheat genotypes using morpho-protein analysis

2014 ◽  
Vol 42 (4) ◽  
pp. 677-686
Author(s):  
M. Rajabi Hashjin ◽  
M.H. Fotokian ◽  
M. Agahee Sarbrzeh ◽  
M. Mohammadi ◽  
D. Talei
Keyword(s):  
Genetic Diversity ◽  
Durum Wheat ◽  
Protein Analysis ◽  
Wheat Genotypes

Flow Boiling at Low Mass Flux

2002 ◽  
Author(s):  
M. E. D. Urso ◽  
V.V. Wadekar ◽  
Geoffrey F. Hewitt
Keyword(s):  
Mass Flux ◽  
Flow Boiling ◽  
Low Mass

Impacts of Sample Preparation Methodology on TEM Failure Analysis of Advanced Semiconductor Devices

2011 ◽  
Author(s):  
Yongkai Zhou ◽  
Jie Zhu ◽  
Han Wei Teo ◽  
ACT Quah ◽  
Lei Zhu ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Case Studies ◽  
Thickness Measurement ◽  
Interface Roughness ◽  
Silicide Formation ◽  
Cross Sectional ◽  
Inspection Method ◽  
Low Mass

Abstract In this paper, two failure analysis case studies are presented to demonstrate the importance of sample preparation procedures to successful failure analyses. Case study 1 establishes that Palladium (Pd) cannot be used as pre-FIB coating for SiO2 thickness measurement due to the spontaneously Pd silicide formation at the SiO2/Si interface. Platinum (Pt) is thus recommended, in spite of the Pt/SiO2 interface roughness, as the pre-FIB coating in this application. In the second case study, the dual-directional TEM inspection method is applied to characterize the profile of the “invisible” tungsten residue defect. The tungsten residue appears invisible in the planeview specimen due to the low mass-thickness contrast. It is then revealed in the cross-sectional TEM inspection.

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