scholarly journals Composition dependence of the local structure and transparency of Gd2O3–B2O3 binary glasses prepared via aerodynamic levitation

2022 ◽  
Vol 130 (1) ◽  
pp. 60-64
Author(s):  
Shunta SASAKI ◽  
Atsunobu MASUNO
1998 ◽  
Vol 541 ◽  
Author(s):  
Koichi Takemura ◽  
Takehiro Noguchi ◽  
Takashi Hase ◽  
Hidekazu Kimura ◽  
Yoichi Miyasaka

AbstractEffects of off-stoichiometry and Nb substitution on the dielectric anomaly and ferroelectric properties have been investigated for SrBi2Ta2O9(SBT) thin films. Local atomic environment for the stoichiometric and off-stoichiometric SBT films has been also measured. The features of the dielectric anomaly, the Curie temperature (Tc), and the temperature dependence of the spontaneous polarization (Ps) are independent of the film thickness, and are governed by the nature of the crystal. For the stoichiometric Sr content SBT films, the grain size increases and the temperature dependence of the remanent polarization (Pr) decreases with increasing thickness. For the films with Sr/Bi/Ta = 0.8/2/2 and 0.8/2.2/2, Sr deficient local structure was observed, and such lattice structure probably leads to higher Tc than the stoichiometric crystal. Nb substitution for Ta also raises Tc, and makes the dielectric anomaly sharper. The phase transition associated with the dielectric anomaly for these films is thought to be first-order.


2006 ◽  
Vol 408-412 ◽  
pp. 1238-1241 ◽  
Author(s):  
Akihiko Kajinami ◽  
Masanori Nakamura ◽  
Shigehito Deki

Author(s):  
G.E. Ice

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.


1982 ◽  
Vol 43 (C9) ◽  
pp. C9-43-C9-46 ◽  
Author(s):  
A. Sadoc ◽  
A. M. Flank ◽  
D. Raoux ◽  
P. Lagarde

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-423-C8-426
Author(s):  
H. OYANAGI ◽  
Y. TAKEDA ◽  
T. MATSUSHITA ◽  
T. ISHIGURO ◽  
A. SASAKI

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-403-C8-406
Author(s):  
N. MOTTA ◽  
A. BALZAROTTI ◽  
P. LETARDI
Keyword(s):  

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