The Materials Science Beamline EDDI for Energy-Dispersive Analysis of Subsurface Residual Stress Gradients

2006 ◽  
Vol 524-525 ◽  
pp. 193-198 ◽  
Author(s):  
Christoph Genzel ◽  
Ingwer A. Denks ◽  
Manuela Klaus
Keyword(s):  
Residual Stress ◽  
Materials Science ◽  
High Energy ◽  
Energy Dispersive ◽  
7 Tesla ◽  
Polycrystalline Materials ◽  
Surface Zone ◽  
Near Surface ◽  
Technical Parameters ◽  
Set Up

In April 2005 the materials science beamline EDDI (Energy Dispersive DIffraction), which the HMI operates at the Berlin synchrotron storage ring BESSY, started user service. The high energy white synchrotron beam up to about 150 keV used for the diffraction experiments is provided by a superconducting 7 Tesla multipole wiggler. Starting with some basic information on the technical parameters of the beamline, its set-up and measuring facilities, the paper focuses on the application of white beam diffraction to the analysis of residual stress fields in the near surface zone of polycrystalline materials. The concept of a program system is introduced, which we offer to our users for preparing and evaluating their measurements performed at the EDDI beamline.

scholarly journals The High Energy Materials Science Beamline (HEMS) at PETRA III

2013 ◽  
Vol 772 ◽  
pp. 57-61 ◽  
Author(s):  
Norbert Schell ◽  
Andrew King ◽  
Felix Beckmann ◽  
Torben Fischer ◽  
Martin Müller ◽  
...  
Keyword(s):  
Smart Materials ◽  
Materials Science ◽  
High Energy ◽  
Test Facility ◽  
Polycrystalline Materials ◽  
Energy Materials ◽  
Friction Stir ◽  
Materials Research ◽  
Set Up

The HEMS beamline at PETRA III has a main energy of 120 keV, is tunable in the range 30-200 keV, and optimized for sub-micrometer focusing with Compound Refractive Lenses. Design, construction, and main funding was the responsibility of the Helmholtz-Zentrum Geesthacht, HZG. Approximately 70 % of the beamtime is dedicated to Materials Research, the rest reserved for “general physics” experiments covered by DESY, Hamburg. The beamline P07 in sector 5 consists of an undulator source optimized for high energies, a white beam optics hutch, an in-house test facility and three independent experimental hutches, plus additional set-up and storage space for long-term experiments. HEMS has partly been operational since summer 2010. First experiments are introduced coming from (a) fundamental research for the investigation of the relation between macroscopic and micro-structural properties of polycrystalline materials, grain-grain-interactions, recrystallisation processes, and the development of new & smart materials or processes; (b) applied research for manufacturing process optimization benefitting from the high flux in combination with ultra-fast detector systems allowing complex and highly dynamic in-situ studies of microstructural transformations, e.g. in-situ friction stir welding; (c) experiments targeting the industrial user community.

scholarly journals Rietveld-based energy-dispersive residual stress evaluation: analysis of complex stress fields σij(z)

2014 ◽  
Vol 47 (2) ◽  
pp. 511-526 ◽  
Author(s):  
Daniel Apel ◽  
Manuela Klaus ◽  
Martin Genzel ◽  
Christoph Genzel
Keyword(s):  
Residual Stress ◽  
Stress Component ◽  
Stress Gradient ◽  
Surface Region ◽  
Real Space ◽  
Energy Dispersive ◽  
Stress Fields ◽  
Polycrystalline Materials ◽  
Near Surface ◽  
Diffraction Patterns

A method for the evaluation of strongly inhomogeneous residual stress fields in the near-surface region of polycrystalline materials is introduced, which exploits the full information content contained in energy-dispersive (ED) diffraction patterns. The macro-stress-induced diffraction line shifts ΔEψhklobserved in ED sin2ψ measurements are described by modeling the residual stress state σij(z) in real space, based on Rietveld's data analysis concept. Therefore, the proposed approach differs substantially from currently used methods for residual stress gradient analysis such as the `universal plot' method, which enable access to the Laplace stress profiles σij(τ). With the example of shot-peened samples made of either 100Cr6 steel or Al2O3, it is demonstrated that the simultaneous refinement of all diffraction patterns obtained in a sin2ψ measurement with hundreds of diffraction lines provides very stable solutions for the residual stress depth profiles. Furthermore, it is shown that the proposed evaluation concept even allows for consideration of the residual stress component σ33(z) in the thickness direction, which is difficult to detect by conventional sin2ψ analysis.

scholarly journals A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

2018 ◽  
Vol 51 (3) ◽  
pp. 732-745 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmański ◽  
Manuela Klaus ◽  
Christoph Genzel ◽  
Adrian Oponowicz ◽  
...  
Keyword(s):  
Residual Stress ◽  
Synchrotron Radiation ◽  
Diffraction Method ◽  
Surface Region ◽  
Grazing Incidence ◽  
High Energy ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray Diffraction ◽  
Near Surface

The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu Kα radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu Kα radiation on the classical diffractometer. A great advantage of high-energy synchrotron radiation was the possibility to measure stresses as well as thea0parameter andc0/a0ratio for much larger depths in comparison with laboratory X-rays.

scholarly journals Thin film stress and microstructure analysis by energy-dispersive diffraction

2014 ◽  
Vol 70 (a1) ◽  
pp. C724-C724
Author(s):  
Christoph Genzel
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Residual Stress ◽  
Film Growth ◽  
High Energy ◽  
Energy Dispersive ◽  
Film Stress ◽  
Ex Situ ◽  
Near Surface

The most important advantage of energy dispersive (ED) diffraction compared with angle dispersive methods is that the former provides complete diffraction patterns in fixed but arbitrarily selectable scattering directions. Furthermore, in experiments that are carried out in reflection geometry, the different photon energies E(hkl) of the diffraction lines in an ED diffraction pattern can be taken as an additional parameter to analyze depth gradients of structural properties in the materials near surface region. For data evaluation advantageous use can be made of whole pattern methods such as the Rietveld method, which allows for line profile analysis to study size and strain broadening [1] or for the refinement of models that describe the residual stress depth distribution [2]. Concerning polycrystalline thin films, the features of ED diffraction mentioned above can be applied to study residual stresses, texture and the microstructure either in ex-situ experiments or in-situ to monitor, for example, the chemical reaction pathway during film growth [3]. The main objective of this talk is to demonstrate that (contrary to a widespread opinion) high energy synchrotron radiation and thin film analysis may fit together. The corresponding experiments were performed on the materials science beamline EDDI at BESSY II which is one of the very few instruments worldwide that is especially dedicated to ED diffraction. On the basis of selected examples it will be shown that specially tailored experimental setups allow for residual stress depth profiling even in thin films and multilayer coatings as well as for fast in situ studies of film stress and microstructure evolution during film growth.

Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept

2013 ◽  
Vol 46 (3) ◽  
pp. 610-618 ◽  
Author(s):  
M. Meixner ◽  
M. Klaus ◽  
Ch. Genzel
Keyword(s):  
Residual Stress ◽  
Energy Dispersive ◽  
Narrow Slit ◽  
X Rays ◽  
Synchrotron Diffraction ◽  
Near Surface ◽  
X Ray ◽  
Least Squares Fit ◽  
Gauge Volume ◽  
Information Depth

The influence of the gauge volume size and shape on the analysis of steep near-surface residual stress gradients by means of energy-dispersive synchrotron diffraction is studied theoretically. Cases are considered where the irradiated sample volume is confined by narrow-slit systems, in both the primary and the diffracted beam, to dimensions comparable to the `natural' 1/einformation depth τ1/eof the X-rays. It is shown that the ratio between τ1/e, defined by the material's absorption, and the immersion depthhGVof the gauge volume into the sample is the crucial parameter that shapes thedψhklor ∊ψhklversussin2ψ distributions obtained in the Ψ mode of X-ray stress analysis. Since the actual information depth 〈z〉GVto which the measured X-ray signal has to be assigned is a superposition of geometrical and exponential weighting functions, ambiguities in the conventional plot of the Laplace stressesversus〈z〉GVmay occur for measurements performed using narrow-slit configurations. To avoid conflicts in data analysis in these cases, a modified formalism is proposed for the evaluation of the real space residual stress profiles σ||(z), which is based on a two-dimensional least-squares fit procedure.

Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods

2013 ◽  
Vol 768-769 ◽  
pp. 3-18 ◽  
Author(s):  
Christoph Genzel ◽  
Daniel Apel ◽  
Manuela Klaus ◽  
Martin Genzel ◽  
Davor Balzar
Keyword(s):  
Residual Stress ◽  
Gradient Analysis ◽  
Stress Gradient ◽  
High Energy ◽  
Real Space ◽  
Multiple Diffraction ◽  
Near Surface ◽  
Measured Strain ◽  
Diffraction Patterns ◽  
Residual Stress Gradient

The paper deals with methods for X-ray stress analysis (XSA), which allow for the evaluation of near surface in-plane residual stress gradients σ||(τ) and σ||(z) in the LAPLACE- and the real space, respectively. Since the ‘robustness’ of residual stress gradient analysis strongly depends on both, the quality of the measured strain data and the number of experimental data points, the discussion aims at those approaches which are based on processing various diffraction lines or even complete diffraction patterns. It is shown that these techniques, which were originally developed for angle-dispersive (AD) diffraction, can be adapted and enhanced for energy-dispersive (ED) diffraction employing high-energy synchrotron radiation. With the example of a shot-peened ferritic steel it is demonstrated, that sin²ψ-data measured in the Ψ-mode of XSA employing the ED diffraction technique can be analyzed on different levels of approximation.

scholarly journals Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

2013 ◽  
Vol 768-769 ◽  
pp. 72-75 ◽  
Author(s):  
Peter Staron ◽  
Torben Fischer ◽  
Jozef Keckes ◽  
Sonja Schratter ◽  
Thomas Hatzenbichler ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Cross Sections ◽  
Materials Science ◽  
Steel Wire ◽  
High Energy ◽  
X Rays ◽  
Energy Materials ◽  
Residual Stress Analysis ◽  
Good Agreement

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.

scholarly journals The High Energy Materials Science Beamline at PETRA III

2008 ◽  
Vol 571-572 ◽  
pp. 261-266 ◽  
Author(s):  
Norbert Schell ◽  
René V. Martins ◽  
Felix Beckmann ◽  
Hans Ulrich Ruhnau ◽  
Rüdiger Kiehn ◽  
...  
Keyword(s):  
Materials Science ◽  
High Energy ◽  
Test Facility ◽  
Energy Materials ◽  
Strain Mapping ◽  
High Energy Materials ◽  
The Future ◽  
Materials Research ◽  
Current Design ◽  
Set Up

The future High Energy Materials Science Beamline HEMS at the new German high brilliance synchrotron radiation storage ring PETRA III [1] will have a main energy of 120 keV, will be fully tunable in the range of 50 to 300 keV, and will be optimized for sub-micrometer focusing with Compound Refractive Lenses and Kirkpatrick-Baez Multilayer mirrors. Design and construction is the responsibility of the Research Center Geesthacht, GKSS, with approximately 70 % of the beamtime being dedicated to Materials Research, the rest reserved for “general physics” experiments covered by DESY, Hamburg. Fundamental research will encompass metallurgy, physics and chemistry. For first experiments in investigating grain-grain-interactions a dedicated 3D-microstructure-mapper will be designed. Applied research for manufacturing process optimization will benefit from the high flux in combination with ultra-fast detector systems allowing complex and highly dynamic in-situ studies of microstructural transformations. The beamline infrastructure will allow easy accommodation of large user provided equipment. Experiments targeting the industrial user community will be based on well established techniques with standardised evaluation, allowing "full service" measurements. Environments for strain mapping [2] on large structural components up to 1 t will be provided as well as automated investigations of large numbers of samples, e.g. for tomography and texture determination. The current design for the beamline (P07 in sector 5 of the future experimental hall) consists of a nearly five meter in-vacuum undulator source (U19-5) optimized for high energies, a general optics hutch, an in-house test facility and three independent experimental hutches working alternately, plus additional set-up and storage space for long-term experiments. HEMS should be operational in spring 2009 as one of the first beamlines running at PETRA III.

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