Temperature Dependent Exciton Funnel Dynamics in Uniform Strain Gradient Field Observed by Time‐Resolved Photoluminescence

2021 ◽  
pp. 2101969
Author(s):  
Xuewen Fu ◽  
Xiang Chen ◽  
Gwenole Jacopin ◽  
Mehran Shahmohammadi ◽  
Chuwei Zhang ◽  
...  
RSC Advances ◽  
2020 ◽  
Vol 10 (72) ◽  
pp. 44373-44381
Author(s):  
Xiaozhe Wang ◽  
Qi Wang ◽  
Zhijun Chai ◽  
Wenzhi Wu

The thermal properties of FAPbBr3 perovskite nanocrystals (PNCs) is investigated by use of temperature-dependent steady-state/time-resolved photoluminescence and first-principle calculations.


2016 ◽  
Vol 70 (12) ◽  
pp. 1974-1980 ◽  
Author(s):  
Justin M. Reynard ◽  
Nathan S. Van Gorder ◽  
Caley A. Richardson ◽  
Richie D. Eriacho ◽  
Frank V. Bright

We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.


Author(s):  
Pham Thi Thuy ◽  
Bui Xuan Vuong

This paper reports on the photoluminescence of porous GaPprepared by electrochemical anodization of (111)-oriented bulk material.Porous and bulk GaP exhibits green and red photoluminescence, respectively when excited by the 355-nm laser. The photoluminescence intensity of porous GaP is much stronger than that of the bulk sample. Temperature-dependent time-resolved photoluminescence shows that the green emission gradually decreases when the temperature increases and the photoluminescence full width at haft maximum (FWHM) slightly narrow with decreasing temperature. These results assigned to the contribution of lattice vibrations. Raman scattering measurement is carried out to confirm the size decreasing of the porous GaP material. Keywords PorousGaP, photoluminescence, time-resolved photoluminescence, electrochemical etching References 1. L. T. Canham, Appl. Phys.Lett. 57, 1046 (1990).2. K. Grigoras, Jpn. J. Appl. Phys. 39, 378 (2000)3. H. Koyama, J. Appl. Electrochem. 36, 999 (2006)4. H. A. Hadi, International Letters of Chemistry, Physics and Astronomy, 17(2), 142-152 (2014).5. S. Setzu, P. Ferrand, and R. Romestain, Mater.Sci. Eng, 34, 69-70 (2000).6. S. E. Letant and M. J. Sailor, Adv. Mater, 355, 12 (2000).7. M. T. Kelly, J. K. M. Chun, and A. B. Bocarsly, Nature, 382, 214 (1996).8. G. Di Francia, V. La Ferrara, L. Quercia, and G. Faglia, J. Porous Mater, 7, 287 (2000).9. J. Drott, K. Lindstrom, L. Rosengren, and T. Laurell, J. Micromech. Microeng, 7, 14 (1997).10. B. P. Azeredo, Y. W. Lin, A. Avagyan, M. Sivaguru, K. Hsu, P. Ferreira, Advanced Functional Materials, 26, 2929-2939 (2016).11. A. Anedda, A. Serpi, V. A. Karavanskii, I. M. Tiginyanu, and V. M. Ichizli, Appl. Phys.Lett, 67, 3316 (1995).12. A. I. Belogorokhov, V. A. Karavanskii, A. N. Obraztsov and V. Yu. Timoshenko, JETP Lett. 60, 274 (1994).13. K. Tomioka, S. Adachi, J. App. Phys, 98, 073511 (2005).14. M. A. Stevens-Kalceff, I. M. Tiginyanu, S. Langa, H. Foll and H. L. Hartnagel, J. App. Phys, 89,2560 (2001).15. A. V. Zoteev, P. K. Kashkarov, A. N. Obraztsov and V. Y. Timoshenko, Semiconductors, 30, 775 (1996).16. A. A. Lebedev, V. Y. Rud and Y. V. Rud, Tech. Phys. Lett, 22, 754 (1996).17. H. Richter, Z. P. Wang, and L. Ley, Solid State Commum, 39, 625 (1981).18. L. H. Campbell and P. M.Fauchet, Solid State Commum, 58, 739 (1986).19. V. V. Ursaki, N. N. Syrbu, S. Albu, V. V. Zalamai, I. M. Tiginyanu, and R. W. Boyd, Semicond. Sci. Technl, 20, 745- 748 (2005)20. R. W. Tjerkstra, Electrochemical and Solid-State Letters,9 (5), C81-C84 (2006)


2006 ◽  
Vol 527-529 ◽  
pp. 461-464 ◽  
Author(s):  
Aurelie Thuaire ◽  
Anne Henry ◽  
Björn Magnusson ◽  
Peder Bergman ◽  
W.M. Chen ◽  
...  

A detailed investigation of the optical and electronic properties of the deep-level defect UD-4 is reported. This defect has recently been observed in 4H semi-insulating silicon carbide, but has hardly been studied yet. Both low temperature and temperature-dependent photoluminescence were collected from the defect. Zeeman spectroscopy measurements were performed as well as time-resolved photoluminescence.


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