Single‐Material, Near‐Infrared Selective Absorber Based on Refractive Index‐Tunable Tamm Plasmon Structure

2022 ◽  
pp. 2102388
Author(s):  
So Hee Kim ◽  
Joo Hwan Ko ◽  
Young Jin Yoo ◽  
Min Seok Kim ◽  
Gil Ju Lee ◽  
...  
2021 ◽  
pp. 413469
Author(s):  
Thu Trang Hoang ◽  
Thanh Son Pham ◽  
Xuan Bach Nguyen ◽  
Huu Tu Nguyen ◽  
Khai Q. Le ◽  
...  

Sensors ◽  
2021 ◽  
Vol 21 (22) ◽  
pp. 7452
Author(s):  
Muhammad A. Butt ◽  
Andrzej Kaźmierczak ◽  
Cuma Tyszkiewicz ◽  
Paweł Karasiński ◽  
Ryszard Piramidowicz

In this paper, a novel and cost-effective photonic platform based on silica–titania material is discussed. The silica–titania thin films were grown utilizing the sol–gel dip-coating method and characterized with the help of the prism-insertion technique. Afterwards, the mode sensitivity analysis of the silica–titania ridge waveguide is investigated via the finite element method. Silica–titania waveguide systems are highly attractive due to their ease of development, low fabrication cost, low propagation losses and operation in both visible and near-infrared wavelength ranges. Finally, a ring resonator (RR) sensor device was modelled for refractive index sensing applications, offering a sensitivity of 230 nm/RIU, a figure of merit (FOM) of 418.2 RIU−1, and Q-factor of 2247.5 at the improved geometric parameters. We believe that the abovementioned integrated photonics platform is highly suitable for high-performance and economically reasonable optical sensing devices.


2012 ◽  
Vol 17 (11) ◽  
pp. 115002 ◽  
Author(s):  
Oleksiy Sydoruk ◽  
Olga Zhernovaya ◽  
Valery Tuchin ◽  
Alexandre Douplik

2003 ◽  
Vol 797 ◽  
Author(s):  
Sean E. Foss ◽  
Terje G. Finstad

ABSTRACTRugate optical reflectance filters with position dependent reflectance peaks in the visible to near infrared spectrum were realized in porous silicon (PS). Filters with strong reflection peaks, near 100%, no detectable higher order harmonics and suppressed sidebands compared to discrete layer filters were obtained by varying the current density continuously and periodically during etching. An in-plane voltage up to 1.5 V was used to obtain refractive index and periodicity change along the filter surface resulting in reflectance peak shifts of up to 100 nm/mm in the direction of the voltage drop. The effect of the lateral change in optical parameters on the filter characteristics is studied by varying the gradient and comparing measurements at different positions with measurements on a non-graded filter. We have observed extra features in the reflectance spectrum of these graded filters compared with reflectance from a non-graded filter which is likely caused by the gradient.


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