Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters

1982 ◽  
pp. 295-300 ◽  
Author(s):  
Briant L. Davis ◽  
L. Ronald Johnson
1981 ◽  
Vol 25 ◽  
pp. 295-300 ◽  
Author(s):  
Briant L. Davis ◽  
L. Ronald Johnson

The purpose of this paper is to summarize the theoretical basis and experimental techniques for application of the referenee intensity method to quantitative, multi-component analysis by x-ray diffraction (XRD). Detailed descriptions of the technique and formal error analysis are discussed by Davis (1978, 1980, 1981a, 1981b, 1981c).


1973 ◽  
Vol 17 ◽  
pp. 75-87
Author(s):  
D. G. Feuerbacher ◽  
R. R. Clark

AbstractQuantitative analysis of six clay minerals commonly found in drilling mud solids is studied by x-ray diffraction using the method of internal standards. Standard clay samples are used with three internal standards to derive calibration curves from which four synthetic mud solids are analyzed. If careful sample preparation and handling are employed, reasonably accurate and reproducible results are obtained.


1969 ◽  
Vol 52 (3) ◽  
pp. 577-581
Author(s):  
A B Carel ◽  
D E Jordan

Abstract Discrepancies in the analysis of superphosphoric acid for iron, aluminum, and phosphorus are found to be directly related to the digestion procedure used for sample preparation. Various acid digestions and combined acid-base digestion data are discussed. Chemical and atomic absorption data are combined to confirm the structure of the acid-insoluble material identified by X-ray diffraction analysis. Recommended digestion procedures are included for the quantitative analysis of superphosphoric acid for iron, aluminum, and phosphorus.


2008 ◽  
Vol 14 (S2) ◽  
pp. 982-983 ◽  
Author(s):  
M Schaffer ◽  
H Schröttner ◽  
J Wagner

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008


Clay Minerals ◽  
2000 ◽  
Vol 35 (1) ◽  
pp. 291-302 ◽  
Author(s):  
S. Hillier

AbstractX-ray diffraction is used widely for quantitative analysis of geological samples but studies which document the accuracy of the methods employed are not numerous. Synthetic sandstones of known composition are used to compare a ‘routine application’ of a Rietveld and a reference intensity ratio (RIR) method of quantitative phase analysis. Both methods give similar results accurate to within ~±3 wt.% at the 95% confidence level. The high degree of accuracy obtained is believed to depend to a large extent on the spray-drying method of sample preparation used to eliminate preferred orientation.


Author(s):  
V. V. Damiano ◽  
R. P. Daniele ◽  
H. T. Tucker ◽  
J. H. Dauber

An important example of intracellular particles is encountered in silicosis where alveolar macrophages ingest inspired silica particles. The quantitation of the silica uptake by these cells may be a potentially useful method for monitoring silica exposure. Accurate quantitative analysis of ingested silica by phagocytic cells is difficult because the particles are frequently small, irregularly shaped and cannot be visualized within the cells. Semiquantitative methods which make use of particles of known size, shape and composition as calibration standards may be the most direct and simplest approach to undertake. The present paper describes an empirical method in which glass microspheres were used as a model to show how the ratio of the silicon Kα peak X-ray intensity from the microspheres to that of a bulk sample of the same composition correlated to the mass of the microsphere contained within the cell. Irregular shaped silica particles were also analyzed and a calibration curve was generated from these data.


Author(s):  
H.J. Dudek

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S


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