Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

2002 ◽  
pp. 151-163
Author(s):  
Jin-Fu Li ◽  
Ruey-Shing Tzeng ◽  
Cheng-Wen Wu ◽  
Krishnendu Chakrabarty
Keyword(s):  
Data Compression ◽  
Diagnostic Data ◽  
Self Test ◽  
Built In Self Test ◽  
Embedded Memories

A data compression technique for built-in self-test

1988 ◽  
Vol 37 (9) ◽  
pp. 1151-1156 ◽  
Author(s):  
S.M. Reddy ◽  
K.K. Saluja ◽  
M.G. Karpovsky
Keyword(s):  
Data Compression ◽  
Compression Technique ◽  
Self Test ◽  
Built In Self Test

Localization of Embedded Memories using EeLADA

2018 ◽  
Author(s):  
M.H. Thor ◽  
S.H. Goh ◽  
Lin Zhao ◽  
B.L. Yeoh ◽  
Y.T. Ngow ◽  
...  
Keyword(s):  
Efficient Method ◽  
Return On Investment ◽  
High Volume ◽  
Embedded Memory ◽  
Cell Level ◽  
Yield Improvement ◽  
Self Test ◽  
Built In Self Test ◽  
Diagnostic Resolution ◽  
Embedded Memories

Abstract Bitmapping based on memory built-in self-test is the most efficient method to locate embedded memory defects in system-on-chips. Although this is the preferred approach to memory yield improvement, the procedure to enable bitmapping can be both time and resource-consuming. Therefore, it is not supported on chips that are not produced in high volume due to the low return on investment. EeLADA was explored as an alternative. Although its feasibility has been proven in a previous report, the localization capability or diagnostic resolution is limited to at best failing bit-lines. This work enhances this technique to achieve a resolution down to bit-cell level with an accuracy of less than 5 µm.

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