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Aging Relaxation at Microarchitecture Level Using Special NOPs
Long-Term Reliability of Nanometer VLSI Systems
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10.1007/978-3-030-26172-6_19
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2019
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pp. 401-414
Author(s):
Sheldon Tan
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Mehdi Tahoori
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Taeyoung Kim
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Shengcheng Wang
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Zeyu Sun
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...
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