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Application of Multi-layered Thresholding Based on Stack of Regions for Unevenly Illuminated Industrial Images
Advances in Intelligent Systems and Computing - Advanced, Contemporary Control
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10.1007/978-3-030-50936-1_65
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2020
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pp. 773-784
Author(s):
Hubert Michalak
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Krzysztof Okarma
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