Defect-Oriented Testing of Microelectronic/Fluidic Systems

Micro Total Analysis Systems 2000 ◽

10.1007/978-94-017-2264-3_72 ◽

2000 ◽

pp. 315-318 ◽

Cited By ~ 3

Author(s):

Hans G. Kerkhoff ◽

Edwin Oosterbroek

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