Atomic Force Microscopy and Scanning Electron Microscopy Reveal Genome–dependent Ultrastructure of Seed Surface

2001 ◽  
Vol 7 (6) ◽  
pp. 526-529
Author(s):  
T. Guha ◽  
R. Bhar ◽  
V. Ganesan ◽  
A. Sen ◽  
R.L. Brahmachary
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Contact Mode ◽  
Surface Ultrastructure ◽  
Force Microscopy ◽  
Seed Surface ◽  
Atomic Force ◽  
Different Strains ◽  
Scanning Electron

AbstractBoth scanning electron microscopy (SEM) and contact mode imaging via atomic force microscopy (AFM) have been utilized to elucidate the ultrastructure of mung bean seed surfaces. The results indicate: 1) that AFM is useful in the examination of seed surface ultrastructure ex-vaccuo without the need for additional complex preparative procedures; and 2) that both the cotyledon and seed coat of different strains of mung beans bear specific ultrastructural details unique to each strain. To our knowledge, these are the first AFM images of seed surfaces.

scholarly journals Corrosion Behavior and Mechanical Properties of a Nanocomposite Superhydrophobic Coating

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 652
Author(s):  
Divine Sebastian ◽  
Chun-Wei Yao ◽  
Lutfun Nipa ◽  
Ian Lian ◽  
Gary Twu
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Nanocomposite Coating ◽  
Superhydrophobic Coating ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images ◽  
Scanning Electron

In this work, a mechanically durable anticorrosion superhydrophobic coating is developed using a nanocomposite coating solution composed of silica nanoparticles and epoxy resin. The nanocomposite coating developed was tested for its superhydrophobic behavior using goniometry; surface morphology using scanning electron microscopy and atomic force microscopy; elemental composition using energy dispersive X-ray spectroscopy; corrosion resistance using atomic force microscopy; and potentiodynamic polarization measurements. The nanocomposite coating possesses hierarchical micro/nanostructures, according to the scanning electron microscopy images, and the presence of such structures was further confirmed by the atomic force microscopy images. The developed nanocomposite coating was found to be highly superhydrophobic as well as corrosion resistant, according to the results from static contact angle measurement and potentiodynamic polarization measurement, respectively. The abrasion resistance and mechanical durability of the nanocomposite coating were studied by abrasion tests, and the mechanical properties such as reduced modulus and Berkovich hardness were evaluated with the aid of nanoindentation tests.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

scholarly journals Characterization of dentin morphology after application of ozone and sodium ascorbate by scanning electron microscopy and atomic force microscopy

RSBO ◽  
2021 ◽  
Vol 17 (2) ◽  
pp. 85-91
Author(s):  
João Batista de Souza ◽  
Daniel Rodrigues ◽  
Paula Cicília Faquim Rodrigues ◽  
Lawrence Gonzaga Lopes ◽  
Tainah Costa Firmiano ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phosphoric Acid ◽  
Sodium Ascorbate ◽  
Acid Etching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Group 3 ◽  
Scanning Electron

The aim of this study was to evaluate dentin morphology after ozone gas and sodium ascorbate application by the Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) images. Material and methods: Seven freshly extracted human third molars were sectioned perpendicularly to the tooth long axis, 3mm above the cementoenamel junction and other section above the first. Dentin slices were obtained, 2 mm thickness, then the slices were sectioned vertically and horizontally into four equal parts, resulting in 28 samples. These were divided in 4 groups (n=7): (G1) phosphoric acid – control; (G2) ozone + phosphoric acid; (G3) phosphoric acid + ozone; and (G4) ozone + sodium ascorbate + phosphoric acid. Dentin morphology of six samples of each groupwas evaluated by SEM and one by AFM. Results: In Groups 2 and 4 there was a change in the effectiveness of acid etching in terms of removing the smear layer. In Group 3 there was a change in the dentin microstructure, which can be a harmful factor regarding the bond strength of adhesive agents. Conclusion: After the qualitative analysis, the application sequences of ozone, phosphoric acid etching and sodium ascorbate application generated differences in the dentinmorphology by SEM and AFM. Sodium ascorbate decreased the ozone effect before the acid etching but did not eliminate it.

scholarly journals Comparison of the Enamel Surface Roughness from Different Polishing Methods: Scanning Electron Microscopy and Atomic Force Microscopy Investigation

2020 ◽  
Vol 14 (02) ◽  
pp. 299-305
Author(s):  
Kiatanan Sugsompian ◽  
Ratchawan Tansalarak ◽  
Thosapol Piyapattamin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Enamel Surface ◽  
Similar Data ◽  
Force Microscopy ◽  
Atomic Force ◽  
Significant Difference ◽  
Scanning Electron

Abstract Objective This study aimed to compare the enamel surface roughness created by four polishing methods after debonding, by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Materials and Methods Four experimental polishing groups (Sof-Lex disc, SD; sandblaster, SB; tungsten carbide bur, TB; and white stone bur, WB) and one control group were selected from 100 premolars (n = 20/group). The experimental teeth were bonded with a bracket, thermocycled, and debonded. Residual adhesive was removed by either of the respective methods. Pre and postdebonding root mean square (Rq) values were obtained from AFM evaluations. All specimens were examined and evaluated with SEM using a modified enamel surface index (modified ESI). Statistical Analysis Differences among the polishing methods were compared with analysis of variance and Fisher’s least significant difference test at p < 0.05. Results Both microscopic evaluations indicated that the surface with the greatest roughness herein belonged to the SD group, followed by that for SB, TB, and WB groups. AFM measurements indicated a maximum postdebonding Rq herein for the WB group and a significantly greater surface roughness for the TB and WB groups than for the SD and SB groups. Among the experimental groups, SEM followed by modified ESI evaluations revealed similar data to those obtained with AFM. Significant differences were seen among all paired groups, except for that between the SB and TB groups. Conclusion Within the limitations of this study, all four polishing methods were concluded to be clinically acceptable for removing residual orthodontic adhesives.

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