Characterization of the small molecule based organic thin film fabricated by electrospray deposition technique

2013 ◽  
Vol 24 (11) ◽  
pp. 4321-4327 ◽  
Author(s):  
Maria Mustafa ◽  
Hyung Chan Kim ◽  
Hui Doh Yang ◽  
Kyung Hyun Choi
2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


2008 ◽  
Vol 46 (15) ◽  
pp. 5115-5122 ◽  
Author(s):  
Yinam Li ◽  
Tae‐Hoon Kim ◽  
Qinghua Zhao ◽  
Euh‐Kyung Kim ◽  
Seung‐Hon Han ◽  
...  

2014 ◽  
Vol 14 (8) ◽  
pp. 5942-5946 ◽  
Author(s):  
Hui-Jun Yun ◽  
Jong-Man Park ◽  
Chan Woo Jeon ◽  
Sang Yong Nam ◽  
Sung-Chul Shin ◽  
...  

Science ◽  
2008 ◽  
Vol 321 (5885) ◽  
pp. 108-111 ◽  
Author(s):  
G. Hlawacek ◽  
P. Puschnig ◽  
P. Frank ◽  
A. Winkler ◽  
C. Ambrosch-Draxl ◽  
...  

2011 ◽  
Vol 23 (10) ◽  
pp. 1172-1172 ◽  
Author(s):  
Christopher J. Bettinger ◽  
Hector A. Becerril ◽  
Do Hwan Kim ◽  
Bang-Lin Lee ◽  
Sangyoon Lee ◽  
...  

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