Methodology for Constructing the Equation of State and Thermodynamic Tables for a New Generation Refrigerant

Author(s):  
V. A. Kolobaev ◽  
S. V. Rykov ◽  
I. V. Kudryavtseva ◽  
E. E. Ustyuzhanin ◽  
P. V. Popov ◽  
...  
2017 ◽  
Vol 13 (S337) ◽  
pp. 225-228
Author(s):  
Morgane Fortin

AbstractSimultaneous measurements of the radius and mass of neutron stars (NSs) are expected from the new generation of X-ray telescopes, potentially constraining the NS equation of state (EoS). However using ‘non-unified’ EoSs with the ones for the core and the crust not based on the same nuclear model can introduce an uncertainty on the radius as large as the precision expected from these instruments. I present two solutions to this problem: a large collection of unified EoSs and an approximate and yet precise approach that, with no need of a crust EoS, provides the relation between the NS mass and radius. I discuss correlations between the NS radius and nuclear parameters, possibly allowing to constrain the NS radius with experiments on Earth. Finally, I show that in spite of the observation of massive NSs, one can not exclude that hyperons appear at high densities in NSs due to the scarcity of the available experimental data.


Minerals ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 636 ◽  
Author(s):  
Frank Stacey

None of the 40+ equations that have been proposed to describe material properties at the pressures of the Earth’s core and mantle have escaped serious criticism. In this paper, some basic algebraic and thermodynamic constraints are reviewed, with the conclusion that the next step should be a re-examination of the relationship between the dependence of the bulk modulus, K, on pressure, P, that is K ′ ≡ d K / d P , and the normalized (dimensionless) pressure, P / K . A linear relationship between 1 / K ′ and P / K terminating at the infinite pressure asymptote, at which these quantities become equal, has been used for analysing properties at extreme pressure, but may be inadequate for calculations requiring precise derivatives of an equation of state. A new analysis indicates that d ( 1 / K ′ ) / d ( P / K ) increases with compression (or P / K ), but there are, at present, no reliable equations representing this. Relationships between higher derivatives of K and the thermodynamic Grüneisen parameter offer the prospect of a resolution of the problem and hence a new generation of fundamentally-based equations of state. Although an earlier conclusion that a completely general ‘universal’ equation is not possible, in principle, is confirmed in this study, the fundamental relationships present strong constraints for the forms of other proposed equations.


Author(s):  
D. Cherns

The use of high resolution electron microscopy (HREM) to determine the atomic structure of grain boundaries and interfaces is a topic of great current interest. Grain boundary structure has been considered for many years as central to an understanding of the mechanical and transport properties of materials. Some more recent attention has focussed on the atomic structures of metalsemiconductor interfaces which are believed to control electrical properties of contacts. The atomic structures of interfaces in semiconductor or metal multilayers is an area of growing interest for understanding the unusual electrical or mechanical properties which these new materials possess. However, although the point-to-point resolutions of currently available HREMs, ∼2-3Å, appear sufficient to solve many of these problems, few atomic models of grain boundaries and interfaces have been derived. Moreover, with a new generation of 300-400kV instruments promising resolutions in the 1.6-2.0 Å range, and resolutions better than 1.5Å expected from specialist instruments, it is an appropriate time to consider the usefulness of HREM for interface studies.


Author(s):  
Jorge Perdigao

In 1955, Buonocore introduced the etching of enamel with phosphoric acid. Bonding to enamel was created by mechanical interlocking of resin tags with enamel prisms. Enamel is an inert tissue whose main component is hydroxyapatite (98% by weight). Conversely, dentin is a wet living tissue crossed by tubules containing cellular extensions of the dental pulp. Dentin consists of 18% of organic material, primarily collagen. Several generations of dentin bonding systems (DBS) have been studied in the last 20 years. The dentin bond strengths associated with these DBS have been constantly lower than the enamel bond strengths. Recently, a new generation of DBS has been described. They are applied in three steps: an acid agent on enamel and dentin (total etch technique), two mixed primers and a bonding agent based on a methacrylate resin. They are supposed to bond composite resin to wet dentin through dentin organic component, forming a peculiar blended structure that is part tooth and part resin: the hybrid layer.


Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.


Author(s):  
Thomas J. Deerinck ◽  
Maryann E. Martone ◽  
Varda Lev-Ram ◽  
David P. L. Green ◽  
Roger Y. Tsien ◽  
...  

The confocal laser scanning microscope has become a powerful tool in the study of the 3-dimensional distribution of proteins and specific nucleic acid sequences in cells and tissues. This is also proving to be true for a new generation of high contrast intermediate voltage electron microscopes (IVEM). Until recently, the number of labeling techniques that could be employed to allow examination of the same sample with both confocal and IVEM was rather limited. One method that can be used to take full advantage of these two technologies is fluorescence photooxidation. Specimens are labeled by a fluorescent dye and viewed with confocal microscopy followed by fluorescence photooxidation of diaminobenzidine (DAB). In this technique, a fluorescent dye is used to photooxidize DAB into an osmiophilic reaction product that can be subsequently visualized with the electron microscope. The precise reaction mechanism by which the photooxidation occurs is not known but evidence suggests that the radiationless transfer of energy from the excited-state dye molecule undergoing the phenomenon of intersystem crossing leads to the formation of reactive oxygen species such as singlet oxygen. It is this reactive oxygen that is likely crucial in the photooxidation of DAB.


Author(s):  
S.J. Krause ◽  
W.W. Adams

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.


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