Strain characterization of Ge 1−x Si x and heavily B-doped Ge layers on Ge(001) by two-dimensional reciprocal space mapping

1996 ◽  
Vol 167 (3-4) ◽  
pp. 495-501 ◽  
Author(s):  
H.H. Radamson ◽  
K.B. Joelsson ◽  
W.-X. Ni ◽  
J. Birch ◽  
J.-E. Sundgren ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Two Dimensional ◽  
Reciprocal Space Mapping ◽  
Strain Characterization

Characterization of metamorphic InxAl1−xAs∕GaAs buffer layers using reciprocal space mapping

2007 ◽  
Vol 101 (6) ◽  
pp. 063523 ◽  
Author(s):  
D. Lee ◽  
M. S. Park ◽  
Z. Tang ◽  
H. Luo ◽  
R. Beresford ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Buffer Layers ◽  
Reciprocal Space Mapping

Asymmetrical reciprocal space mapping using X-ray diffraction: a technique for structural characterization of GaN/AlN superlattices

CrystEngComm ◽  
2017 ◽  
Vol 19 (22) ◽  
pp. 2977-2982 ◽  
Author(s):  
H. V. Stanchu ◽  
A. V. Kuchuk ◽  
M. Barchuk ◽  
Yu. I. Mazur ◽  
V. P. Kladko ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Space Mapping ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
X Ray

Angle calculations for an area detector on a two-axis arm: application to powder diffraction

2014 ◽  
Vol 47 (5) ◽  
pp. 1769-1771
Author(s):  
P. S. Normile
Keyword(s):  
Diffraction Pattern ◽  
Powder Diffraction ◽  
Azimuthal Angle ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Two Dimensional ◽  
Reciprocal Space Mapping ◽  
Area Detector

A procedure for the reduction (integration) of a two-dimensional powder diffraction pattern registered with an area detector after rotation about two orthogonal diffractometer axes is described. The procedure involves the conversion from pixel coordinates to scattering and azimuthal angle {2θ, ψ} coordinates. The article concludes with a mention of two possible applications of the procedure to studies of reciprocal space mapping with an area detector.

Structural Characterization of BiFeO3Thin Films by Reciprocal Space Mapping

2006 ◽  
Vol 45 (9B) ◽  
pp. 7311-7314 ◽  
Author(s):  
Keisuke Saito ◽  
Alexander Ulyanenkov ◽  
Volkmar Grossmann ◽  
Heiko Ress ◽  
Lutz Bruegemann ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping

In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

2016 ◽  
pp. 507-544 ◽  
Author(s):  
Peter Siffalovic ◽  
Karol Vegso ◽  
Martin Hodas ◽  
Matej Jergel ◽  
Yuriy Halahovets ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
X Ray

Characterization of Nanoscale Domain Structures in Epitaxial Ferroelectric PbTiO3 Capacitors by Reciprocal Space Mapping

2007 ◽  
Author(s):  
Kilho Lee ◽  
Hee Han ◽  
Hyunjung Yi ◽  
Yong Jun Park ◽  
Jae-Young Choi ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
Domain Structures

X-ray characterization of epi-Ge/Pr2 O3 /Si(111) layer stacks by pole figures and reciprocal space mapping

2009 ◽  
Vol 206 (8) ◽  
pp. 1809-1815 ◽  
Author(s):  
Peter Zaumseil ◽  
Alessandro Giussani ◽  
Peter Rodenbach ◽  
Thomas Schroeder
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Pole Figures
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