Electrochemical, 3D topography, XPS, and ToF-SIMS analyses of 4-methyl-2-phenylimidazole as a corrosion inhibitor for brass

This work presents a detailed surface analytical study and surface characterization, with an emphasis on the X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses of 2‑mercapto‑1‑methylimidazole (MMI) as a corrosion inhibitor for brass. First, the electrochemical measurements demonstrated a corrosion inhibition effect of MMI in a 3 wt.% NaCl solution. Next, the formation of the MMI surface layer and its properties after 1 month of immersion was analyzed with attenuated total reflectance–Fourier-transform infrared spectroscopy, atomic force microscopy, field-emission scanning electron microscopy, and contact angle analysis. Moreover, to gradually remove the organic surface layer, a gas cluster ion beam (GCIB) sputtering source at different accelerated voltages and cluster sizes was employed. After each sputtering cycle, a high-resolution XPS analysis was performed. Moreover, an angle‑resolved XPS analysis was carried out for the MMI-treated brass sample to analyze the heterogeneous layered structure (the interface of the MMI organic/inorganic brass substrate). The interface properties were also investigated in detail using ToF-SIMS for spectra measurements and 2D imaging. Special attention was devoted to the possible spectral interferences for MMI‑related species. The thermal stability of different MMI-related species using molecular-specific signals without possible spectral interferences was determined by performing a cooling/heating experiment associated with ToF-SIMS measurements. It was shown that these species desorbed from the brass surface in the temperature range of 310–370 °C.

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Advanced surface analysis using GCIB-C60++-tandem-ToF-SIMS and GCIB-XPS of 2-mercaptobenzimidazole corrosion inhibitor on brass

Microchemical Journal ◽

10.1016/j.microc.2020.105495 ◽

2020 ◽

Vol 159 ◽

pp. 105495

Author(s):

Matjaž Finšgar

Keyword(s):

Corrosion Inhibitor ◽

Surface Analysis ◽

Tof Sims

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The influence of the amino group in 3‐amino‐1,2,4‐triazole corrosion inhibitor on the interface properties for brass studied by ToF‐SIMS

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.9056 ◽

2021 ◽

Vol 35 (7) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Corrosion Inhibitor ◽

Amino Group ◽

Interface Properties ◽

Tof Sims

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Electrochemical, ToF-SIMS and computational studies of 4-amino-5-methyl-4H-1,2,4-triazole-3-thiol as a novel corrosion inhibitor for copper in 3.5% NaCl

Journal of Molecular Liquids ◽

10.1016/j.molliq.2019.111113 ◽

2019 ◽

Vol 289 ◽

pp. 111113 ◽

Cited By ~ 29

Author(s):

Dheeraj Singh Chauhan ◽

M.A. Quraishi ◽

C. Carrière ◽

A. Seyeux ◽

P. Marcus ◽

...

Keyword(s):

Corrosion Inhibitor ◽

Computational Studies ◽

Tof Sims

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2-Phenylimidazole Corrosion Inhibitor on Copper: An XPS and ToF-SIMS Surface Analytical Study

Coatings ◽

10.3390/coatings11080966 ◽

2021 ◽

Vol 11 (8) ◽

pp. 966

Author(s):

Matjaž Finšgar

Keyword(s):

Surface Layer ◽

Corrosion Inhibitor ◽

Photoelectron Spectroscopy ◽

Analytical Study ◽

Ion Beam ◽

Principal Component ◽

Ion Beam Sputtering ◽

Organometallic Complex ◽

Xps Spectra ◽

Tof Sims

This work presents a surface analytical study of the corrosion inhibitor 2-phenylimidazole (2PhI) adsorbed on a Cu surface from 3 wt.% NaCl solution. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to investigate the surface phenomena. Various XPS experiments were performed, i.e., survey- and angle-resolved high-resolution XPS spectra measurements, gas cluster ion beam sputtering in conjunction with XPS measurements, and XPS imaging in conjunction with principal component analysis. These measurements were used to detail the composition of the surface layer at depth. In addition, various ToF-SIMS experiments were performed, such as positive ion ToF-SIMS spectral measurements, ToF-SIMS imaging, and cooling/heating in conjunction with ToF-SIMS measurements. This study shows that organometallic complexes were formed between 2PhI molecules and Cu ions, that the surface layer contained entrapped NaCl, that the surface layer contained some Cu(II) species (but the majority of species were Cu(I)-containing species), that the surface was almost completely covered with a combination of 2PhI molecules and organometallic complex, and that the temperature stability of these species increases when 2PhI is included in the organometallic complex.

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Surface analysis of the 2-mercaptobenzothiazole corrosion inhibitor on 6082 aluminum alloy using ToF-SIMS and XPS

Analytical Methods ◽

10.1039/c9ay02293g ◽

2020 ◽

Vol 12 (4) ◽

pp. 456-465 ◽

Cited By ~ 2

Author(s):

Matjaž Finšgar

Keyword(s):

Aluminum Alloy ◽

Corrosion Inhibitor ◽

Surface Analysis ◽

Tof Sims ◽

6082 Aluminum Alloy ◽

Xps Study

The first ToF-SIMS and XPS study of the 2-mercaptobenzothiazole (MBTH) corrosion inhibitor adsorbed on 6082 aluminum alloy (AA6082).

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Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135149 ◽

1990 ◽

Vol 48 (2) ◽

pp. 308-309

Author(s):

Bruno Schueler ◽

Robert W. Odom

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Structural Information ◽

Time Of Flight ◽

Biological Tissues ◽

Polymer Surfaces ◽

Tof Sims ◽

Secondary Ions ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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