In-situ Probing the Near-Surface Structural Thermal Stability of High-Nickel Layered Cathode Materials

Author(s):  
Jiyang Li ◽  
Haiming Hua ◽  
Xiangbang Kong ◽  
Huiya Yang ◽  
Pengpeng Dai ◽  
...  
2014 ◽  
Vol 6 (24) ◽  
pp. 22594-22601 ◽  
Author(s):  
Seong-Min Bak ◽  
Enyuan Hu ◽  
Yongning Zhou ◽  
Xiqian Yu ◽  
Sanjaya D. Senanayake ◽  
...  

2020 ◽  
Vol 7 (12) ◽  
pp. 1902413 ◽  
Author(s):  
Eunkang Lee ◽  
Shoaib Muhammad ◽  
Taewhan Kim ◽  
Hyunchul Kim ◽  
Wontae Lee ◽  
...  

1993 ◽  
Vol 16 (5) ◽  
pp. 260-264 ◽  
Author(s):  
H.Y. Tong ◽  
B.Z. Ding ◽  
H.G. Jiang ◽  
Z.Q. Hu ◽  
L. Dong ◽  
...  

2007 ◽  
Vol 50 (3) ◽  
pp. 677 ◽  
Author(s):  
Jae-Wook Jae-Wook ◽  
Kyung-Hwan Kyung-Hwan ◽  
Hyoungsub Hyoungsub ◽  
Cheol-Woong Cheol-Woong ◽  
Dongwon Dongwon ◽  
...  

Nanomaterials ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 210
Author(s):  
Xiangdong Yang ◽  
Haitao Wang ◽  
Peng Wang ◽  
Xuxin Yang ◽  
Hongying Mao

Using in situ ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) measurements, the thermal behavior of octadecyltrichlorosilane (OTS) and 1H, 1H, 2H, and 2H-perfluorooctyltriethoxysilane (PTES) monolayers on SiO2 substrates has been investigated. OTS is thermally stable up to 573 K with vacuum annealing, whereas PTES starts decomposing at a moderate temperature between 373 K and 423 K. Vacuum annealing results in the decomposition of CF3 and CF2 species rather than desorption of the entire PTES molecule. In addition, our UPS results reveal that the work function (WF)of OTS remains the same after annealing; however WF of PTES decreases from ~5.62 eV to ~5.16 eV after annealing at 573 K.


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