Optimal identification of Be-doped Al0.29Ga0.71As Schottky diode parameters using Dragonfly Algorithm: A thermal effect study

2021 ◽  
pp. 107085
Author(s):  
Walid Filali ◽  
Rachid Amrani ◽  
Elyes Garoudja ◽  
Slimane Oussalah ◽  
Fouaz Lekoui ◽  
...  
2004 ◽  
Vol 268 (3-4) ◽  
pp. 607-611 ◽  
Author(s):  
S.W Chung ◽  
W.J Hwang ◽  
Chin C Lee ◽  
M.W Shin

2015 ◽  
Vol 27 (5) ◽  
pp. 51009
Author(s):  
王万祎 Wang Wanyi ◽  
雷訇 Lei Hong ◽  
郭猛 Guo Meng ◽  
惠勇凌 Hui Yongling ◽  
姜梦华 Jiang Menghua ◽  
...  

2009 ◽  
Vol 36 (1) ◽  
pp. 37-42
Author(s):  
朱广志 Zhu Guangzhi ◽  
朱晓 Zhu Xiao ◽  
朱长虹 Zhu Changhong ◽  
齐丽君 Qi Lijun ◽  
胡涛 Hu Tao ◽  
...  

2011 ◽  
Author(s):  
Yi Chen ◽  
M. Maniruzzaman ◽  
Seongcheol Mun ◽  
Jaehwan Kim

2008 ◽  
Vol 255 (4) ◽  
pp. 1490-1493 ◽  
Author(s):  
Rong Ji ◽  
Thomas Liew ◽  
T.C. Chong

2001 ◽  
Author(s):  
Jianhui Gu ◽  
Eugene Tay ◽  
Puay K. Lim ◽  
Pean Lim

Author(s):  
T. Sato ◽  
S. Kitamura ◽  
T. Sueyoshl ◽  
M. Iwatukl ◽  
C. Nielsen

Recently, the growth process and relaxation process of crystalline structures were studied by observing a SI nano-pyramid which was built on a Si surface with a UHV-STM. A UHV-STM (JEOL JSTM-4000×V) was used for studying a heated specimen, and the specimen was kept at high temperature during observation. In this study, the nano-fabrication technique utilizing the electromigration effect between the STM tip and the specimen was applied. We observed Si atoms migrated towords the tip on a high temperature Si surface.Clean surfaces of Si(lll)7×7 and Si(001)2×l were prepared In the UHV-STM at a temperature of approximately 600 °C. A Si nano-pyramid was built on the Si surface at a tunneling current of l0nA and a specimen bias voltage of approximately 0V in both polarities. During the formation of the pyramid, Images could not be observed because the tip was stopped on the sample. After the formation was completed, the pyramid Image was observed with the same tip. After Imaging was started again, the relaxation process of the pyramid started due to thermal effect.


1976 ◽  
Vol 37 (C6) ◽  
pp. C6-783-C6-785 ◽  
Author(s):  
E. G. DA SILVA ◽  
A. ABRAS ◽  
A. O. R. SETTE CAMARA

1979 ◽  
Vol 40 (C2) ◽  
pp. C2-350-C2-352 ◽  
Author(s):  
D. Chambaere ◽  
A. Govaert ◽  
E. de Grave ◽  
G. Harts ◽  
G. Robbrecht

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