Structure determination of the indium induced Si(001)-(4 × 3) reconstruction by surface X-ray diffraction and scanning tunneling microscopy
1998 ◽
Vol 123-124
◽
pp. 104-110
◽
1989 ◽
Vol 47
◽
pp. 30-31
1994 ◽
Vol 50
(16)
◽
pp. 12246-12249
◽
1996 ◽
Vol 14
(2)
◽
pp. 1121
◽
1999 ◽
Vol 214
(12)
◽
2000 ◽
Vol 104
(6)
◽
pp. 1285-1291
◽