Comparison of Techniques for EELS Mapping in Biology

Author(s):  
R.D. Leapman ◽  
S.B. Andrews

Elemental mapping of biological specimens by electron energy loss spectroscopy (EELS) can be carried out both in the scanning transmission electron microscope (STEM), and in the energy-filtering transmission electron microscope (EFTEM). Choosing between these two approaches is complicated by the variety of specimens that are encountered (e.g., cells or macromolecules; cryosections, plastic sections or thin films) and by the range of elemental concentrations that occur (from a few percent down to a few parts per million). Our aim here is to consider the strengths of each technique for determining elemental distributions in these different types of specimen.On one hand, it is desirable to collect a parallel EELS spectrum at each point in the specimen using the ‘spectrum-imaging’ technique in the STEM. This minimizes the electron dose and retains as much quantitative information as possible about the inelastic scattering processes in the specimen. On the other hand, collection times in the STEM are often limited by the detector read-out and by available probe current. For example, a 256 x 256 pixel image in the STEM takes at least 30 minutes to acquire with read-out time of 25 ms. The EFTEM is able to collect parallel image data using slow-scan CCD array detectors from as many as 1024 x 1024 pixels with integration times of a few seconds. Furthermore, the EFTEM has an available beam current in the µA range compared with just a few nA in the STEM. Indeed, for some applications this can result in a factor of ~100 shorter acquisition time for the EFTEM relative to the STEM. However, the EFTEM provides much less spectral information, so that the technique of choice ultimately depends on requirements for processing the spectrum at each pixel (viz., isolated edges vs. overlapping edges, uniform thickness vs. non-uniform thickness, molar vs. millimolar concentrations).

Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.


2000 ◽  
Vol 6 (S2) ◽  
pp. 162-163
Author(s):  
S.B. Andrews ◽  
J. Hongpaisan ◽  
N.B. Pivovarova ◽  
D.D. Friel ◽  
R.D. Leapman

In the context of biological specimens, it is in principle desirable to quantitatively map, rather than just point analyze, the distribution of physiologically important elements, and to do so at subcellular resolution. Presently, this can be accomplished by electron energy loss spectrum-imaging (EELSI) in both the scanning transmission electron microscope (STEM) and the energy-filtering transmission electron microscope (EFTEM). Until recently, this approach has been of limited value for mapping the particularly important element Ca, mainly because intracellular total Ca concentrations are normally quite low (<5 mmol/kg dry weight) and because the background in the vicinity of the Ca L23 edge is complex and requires precise background modeling to extract the very weak Ca signals. As a result, the Ca signal is usually not high enough to reach detection threshold during a practical EELSI acquisition time.


2006 ◽  
Vol 527-529 ◽  
pp. 481-484 ◽  
Author(s):  
W. Sullivan ◽  
John W. Steeds

Samples of 4H SiC, both n- and p-doped, have been irradiated with low-energy electrons in a transmission electron microscope. The dependence of the silicon vacancy-related V1 ZPL doublet (~860nm) on electron energy and electron dose has been investigated by low temperature photoluminescence spectroscopy. Furthermore, this luminescence centre has been studied across a broad range of samples of various doping levels. Some annealing characteristics of this centre are reported.


2000 ◽  
Vol 6 (S2) ◽  
pp. 160-161
Author(s):  
R.D. Leapman ◽  
C.M. Brooks ◽  
N.W. Rizzo ◽  
T.L. Talbot

Electron energy loss spectrum-imaging (EELSI) in the energy filtering transmission electron microscope (EFTEM) can provide more accurate analysis of elemental distributions than that obtainable by the standard two-window or three-window background subtraction techniques. Spectra containing many channels can be extracted from regions of interest and analyzed using established methods for quantitation. For example, the pre-edge background can be fitted by an inverse power law and subtracted from the post-edge spectrum. EELSI in the EFTEM is often superior to spectrum-imaging in the scanning transmission electron microscope for mapping specimen regions of size greater than 1 μm. This is due the much larger total beam current that is available at the specimen in a fixed-beam microscope relative to a scanned-beam microscope. Our aim here is demonstrate the advantages of such EELSI measurements for analysis of biological specimens. However, we also indicate some potential pitfalls in acquiring elemental maps in the EFTEM, which can be attributed to specimen instabilities during the acquisition.


Author(s):  
R.G. Rosemeier ◽  
M.E. Taylor ◽  
A.G. Wylie

There are a number of factors that limit transmission electron microscope (TEM) characterization. For example, when it is necessary to statistically assess large numbers of samples quickly, conventional time consuming film recording is not a plausible solution. In the case of many electron beam sensitive biological, polymeric, and fiber materials, great care must be taken to avoid both specimen damage or structure change by using minimum electron beam current densities. On the other hand, for mineral specimens, which are in general difficult to thin, maximum electron beam currents may not be high enough to produce anything but faint TEM images. As a result, a low cost portable TEM image (TEMI) intensifier was developed that allows both direct viewing of faint electron diffraction phenomenon as well as conventional TEM viewing. Figure 1 shows the portable high gain TEMI intensifier.


2007 ◽  
Vol 556-557 ◽  
pp. 313-318 ◽  
Author(s):  
John W. Steeds

Use of a transmission electron microscope to irradiate silicon carbide samples has been demonstrated as a useful additional characterisation technique. The photoluminescence spectra of crystal defects introduced in this way have been found to be extremely rich in detail, involving more than 50 zero phonon lines. It is perhaps disappointing that relatively few of these optical centres have been identified conclusively. Indeed, controversy exists over most of the interpretations that have been advanced. As a step towards clarifying this situation we have been studying many of the more important photoluminescent systems by investigating the dependence of the results on the sample n- and p-doping levels, their stoichiometry, the source of supply, the electron dose, the subsequent annealing history, and by exploiting two new aspects of the technique that will be introduced here. A brief review will be given of new results obtained for some of the major optical centres. Most of the irradiations have been performed at room temperature using 300 kV electrons but some were carried out at 750°C.


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