Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy

R. Kirchhofer; D.R. Diercks; B.P. Gorman; G.L. Brennecka

doi:10.1017/s1431927613006892

Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927613006892 ◽

2013 ◽

Vol 19 (S2) ◽

pp. 980-981 ◽

Cited By ~ 2

Author(s):

R. Kirchhofer ◽

D.R. Diercks ◽

B.P. Gorman ◽

G.L. Brennecka

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Atom Probe ◽

Atomic Scale ◽

Transmission Electron ◽

Scale Composition

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Pure Niobium Using Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy

ACS Nano ◽

10.1021/nn305029b ◽

2012 ◽

Vol 7 (1) ◽

pp. 732-739 ◽

Cited By ~ 35

Author(s):

Yoon-Jun Kim ◽

Runzhe Tao ◽

Robert F. Klie ◽

David N. Seidman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Scanning Transmission Electron Microscopy ◽

Atom Probe ◽

Atomic Scale ◽

Pure Niobium ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Atomic-scale analysis of carbon partitioning between martensite and austenite by atom probe tomography and correlative transmission electron microscopy

Acta Materialia ◽

10.1016/j.actamat.2013.10.064 ◽

2014 ◽

Vol 65 ◽

pp. 215-228 ◽

Cited By ~ 136

Author(s):

Yuki Toji ◽

Hiroshi Matsuda ◽

Michael Herbig ◽

Pyuck-Pa Choi ◽

Dierk Raabe

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Atom Probe ◽

Carbon Partitioning ◽

Atomic Scale ◽

Scale Analysis ◽

Transmission Electron

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Atomic scale characterization of titanium Ohmic contacts to SiC using three dimensional atom probe tomography and high resolution transmission electron microscopy

Applied Physics Letters ◽

10.1063/1.3464322 ◽

2010 ◽

Vol 97 (2) ◽

pp. 024103 ◽

Cited By ~ 3

Author(s):

M. H. Maneshian ◽

K. C. Mahdak ◽

F. L. Kuo ◽

J. Y. Hwang ◽

R. Banerjee ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Ohmic Contacts ◽

Three Dimensional ◽

Atom Probe ◽

Atomic Scale ◽

Transmission Electron ◽

Scale Characterization

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A Correlative Study of Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Niobium Utilized Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927613012142 ◽

2013 ◽

Vol 19 (S2) ◽

pp. 2030-2031

Author(s):

D.N. Seidman ◽

Y.-J. Kim ◽

R.F. Klie ◽

R. Tao

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Scanning Transmission Electron Microscopy ◽

Atom Probe ◽

Atomic Scale ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Atomic Scale Structure and Chemistry Study of Franckeite - A Natural van-der-Waals Heterostructure - Using Scanning Transmission Electron Microscopy and Atom Probe Tomography

Microscopy and Microanalysis ◽

10.1017/s1431927620018814 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1642-1643

Author(s):

Hannes Zschiesche ◽

Melis Aygar ◽

Brian Langelier ◽

Thomas Szkopek ◽

Gianluigi Botton

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Scanning Transmission Electron Microscopy ◽

Van Der Waals ◽

Atom Probe ◽

Atomic Scale ◽

Van Der Waals Heterostructure ◽

Transmission Electron ◽

Scanning Transmission

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Atomic Scale Investigation of Impurity 3D Distribution in Nanocrystalline Ni Processed by SPD

Materials Science Forum ◽

10.4028/www.scientific.net/msf.667-669.169 ◽

2010 ◽

Vol 667-669 ◽

pp. 169-174 ◽

Cited By ~ 2

Author(s):

Xavier Sauvage ◽

Gerhard Wilde ◽

Ruslan Valiev

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

High Pressure Torsion ◽

Atom Probe ◽

Impurity Distribution ◽

Atomic Scale ◽

Reduction Mechanism ◽

Transmission Electron ◽

Influence Of Impurities

Some nanocrystaline Ni was prepared by repeated cold rolling with intermediate folding (F&R). The material was then processed by High Pressure Torsion (HPT) to study the grain evolution under additional Severe Plastic Deformation (SPD). Microstructures were characterized by Transmission Electron Microscopy (TEM) and the impurity distribution was analyzed by Atom Probe Tomography (APT). In this paper, we discuss about the influence of impurities on the grain growth during HPT and on the grain size reduction mechanism during SPD.

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Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale Tomography

Microscopy and Microanalysis ◽

10.1017/s1431927620024873 ◽

2021 ◽

Vol 27 (1) ◽

pp. 140-148

Author(s):

Anna V. Ceguerra ◽

Andrew J. Breen ◽

Julie M. Cairney ◽

Simon P. Ringer ◽

Brian P. Gorman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Scanning Transmission Electron Microscopy ◽

Atom Probe ◽

Atomic Scale ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

Abstract

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Origins of meteoritic nanodiamonds investigated by coordinated atom‐probe tomography and transmission electron microscopy studies

Meteoritics and Planetary Science ◽

10.1111/maps.13373 ◽

2019 ◽

Vol 55 (6) ◽

pp. 1382-1403 ◽

Cited By ~ 1

Author(s):

Josiah B. Lewis ◽

Christine Floss ◽

Dieter Isheim ◽

Tyrone L. Daulton ◽

David N. Seidman ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Atom Probe ◽

Transmission Electron

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Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films

Microscopy and Microanalysis ◽

10.1017/s143192761700410x ◽

2017 ◽

Vol 23 (S1) ◽

pp. 688-689

Author(s):

Jorg M.K. Wiezorek ◽

Kai W. Zweiacker ◽

Can Liu ◽

Isabelle Martin ◽

Ty. J. Prosa ◽

...

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Scanning Transmission Electron Microscopy ◽

Atom Probe ◽

Cu Alloy ◽

Transmission Electron ◽

Scanning Transmission ◽

Solidification Microstructures

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Exploring Mars at the nanoscale: Applications of transmission electron microscopy and atom probe tomography in planetary exploration

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/891/1/012008 ◽

2020 ◽

Vol 891 ◽

pp. 012008

Author(s):

L Daly ◽

M R Lee ◽

P Bagot ◽

J Halpin ◽

W Smith ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atom Probe Tomography ◽

Atom Probe ◽

Planetary Exploration ◽

Transmission Electron

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