Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM)
2008 ◽
Vol 10
(1)
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pp. 11-22
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2010 ◽
Vol 62
(6)
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pp. 399-402
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2012 ◽
Vol 174-177
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pp. 508-511
2009 ◽
Vol 15
(S2)
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pp. 368-369
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