High-Pressure Studies of Trimethylsilane Azide by Raman Scattering and Synchrotron X–ray Diffraction

Author(s):  
Yang Wen ◽  
Shang Zuzhen ◽  
Jiang Junru ◽  
Zhu Hongyang ◽  
Hou Xinmei ◽  
...  
RSC Advances ◽  
2016 ◽  
Vol 6 (69) ◽  
pp. 65031-65037 ◽  
Author(s):  
Junru Jiang ◽  
Jianguo Zhang ◽  
Peifen Zhu ◽  
Jianfu Li ◽  
Xiaoli Wang ◽  
...  

Molecular structure (a) and packing diagram (b) of 1. The green, grey, blue, red, and white spheres denote Ni, C, N, O, and H atoms, respectively.


2016 ◽  
Vol 120 (46) ◽  
pp. 12015-12022 ◽  
Author(s):  
Junru Jiang ◽  
Peifen Zhu ◽  
Dongmei Li ◽  
Yanmei Chen ◽  
Miaoran Li ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (101) ◽  
pp. 98921-98926 ◽  
Author(s):  
Junru Jiang ◽  
Peifen Zhu ◽  
Dongmei Li ◽  
Yanmei Chen ◽  
Miaoran Li ◽  
...  

The azide group becomes increasingly asymmetric with increasing pressure, and the amorphization pressure of azide group is much lower than that of inorganic azide.


2013 ◽  
Vol 22 (1) ◽  
pp. 016103 ◽  
Author(s):  
Heng-Nan Liang ◽  
Chun-Li Ma ◽  
Fei Du ◽  
Qi-Liang Cui ◽  
Guang-Tian Zou

2013 ◽  
Vol 102 (12) ◽  
pp. 121902 ◽  
Author(s):  
Xiaoxin Wu ◽  
Hang Cui ◽  
Jian Zhang ◽  
Ridong Cong ◽  
Hongyang Zhu ◽  
...  

2014 ◽  
Vol 43 (25) ◽  
pp. 9647-9654 ◽  
Author(s):  
K. Woodhead ◽  
S. Pascarelli ◽  
A. L. Hector ◽  
R. Briggs ◽  
N. Alderman ◽  
...  

The high pressure behavior of TaON was studied using a combination of Raman scattering, synchrotron X-ray diffraction, and X-ray absorption spectroscopy in diamond anvil cells to 70 GPa at ambient temperature to reveal evidence for a new structural transformation near 30 GPa.


1999 ◽  
Vol 85 (12) ◽  
pp. 8092-8096 ◽  
Author(s):  
C. S. Yang ◽  
C. S. Ro ◽  
W. C. Chou ◽  
C. M. Lin ◽  
D. S. Chuu ◽  
...  

RSC Advances ◽  
2015 ◽  
Vol 5 (50) ◽  
pp. 40336-40340 ◽  
Author(s):  
Yanping Huang ◽  
Xiaoli Huang ◽  
Lu Wang ◽  
Gang Wu ◽  
Defang Duan ◽  
...  

The high-pressure behavior of ammonium iodide (NH4I) has been investigated by in situ synchrotron X-ray diffraction (XRD) and Raman scattering up to 40 GPa.


2000 ◽  
Vol 7 (4) ◽  
pp. 257-261 ◽  
Author(s):  
Andrei V. Sapelkin ◽  
Sue C. Bayliss ◽  
Dean Russell ◽  
Simon M. Clark ◽  
Andy J. Dent

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