Interface trap generation in MOS transistors at high current densities

1998 ◽  
Vol 34 (19) ◽  
pp. 1889 ◽  
Author(s):  
A. Neugroschel ◽  
C.-T. Sah ◽  
W. Cao
2021 ◽  
Author(s):  
Yanfang Song ◽  
Joao R. C. Junqueira ◽  
Nivedita Sikdar ◽  
Denis Öhl ◽  
Stefan Dieckhöfer ◽  
...  

Author(s):  
Yanfang Song ◽  
Joao R. C. Junqueira ◽  
Nivedita Sikdar ◽  
Denis Öhl ◽  
Stefan Dieckhöfer ◽  
...  

2021 ◽  
pp. 2104243
Author(s):  
Xinyue Wang ◽  
Shaohua Feng ◽  
Weichao Lu ◽  
Yingjie Zhao ◽  
Sixing Zheng ◽  
...  

1991 ◽  
Vol 165 (1) ◽  
pp. 211-217
Author(s):  
K. Oyamada ◽  
V. G. Peschanskii ◽  
D. I. Stepanenko

JOM ◽  
1959 ◽  
Vol 11 (8) ◽  
pp. 528-534 ◽  
Author(s):  
S. J. Wallden ◽  
S. T. Henriksson ◽  
P. G. Arbstedt ◽  
Th. Miöen

Sign in / Sign up

Export Citation Format

Share Document