Electrical stressing effects in commercial power VDMOSFETs

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:20050050 ◽

2006 ◽

Vol 153 (3) ◽

pp. 281 ◽

Author(s):

N. Stojadinovi ◽

I. Mani ◽

V. Davidovi ◽

D. Dankovi ◽

S. Djori-Veljkovi ◽

...

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