Effects of Nonuniform Tire Contact Pressures on Near-Surface Pavement Response

Author(s):  
Jeremiah M. Stache ◽  
W. Jeremy Robinson
Author(s):  
Reynaldo Roque ◽  
Leslie Ann Myers ◽  
Bjorn Birgisson

Recent research has indicated that measured contact stress distributions under radial truck tires are highly complex. These stress distributions help to explain near-surface distresses that have become more prevalent since the inception of radial tires, indicating that realistic contact stresses must be considered when pavement response and performance are evaluated. However, because of the complexities involved in measuring contact stresses under tires, obtaining these measurements directly on real pavements is not possible. Consequently, contact stress measurements have been made on systems having rigid foundations with embedded sensors. Therefore, determining whether tire contact stresses measured on a rigid foundation are significantly different from contact stresses under the same tire on an actual pavement is critical. Finite element analyses conducted indicated that both vertical and lateral tire contact stresses measured on rigid foundations accurately represent the contact stresses for the same tire on typical asphalt pavement structures. Some minor differences were observed for thin (50-mm surface) pavements on weak bases, but the correspondence in terms of both distribution and magnitude was still very good. The conclusion was that contact stresses measured by devices with rigid foundations appear to be suitable for predicting response and performance of highway pavements.


2007 ◽  
Vol 129 (4) ◽  
pp. 942-951 ◽  
Author(s):  
Sarmistha Das ◽  
K. Varalakshmi ◽  
V. Jayaram ◽  
S. K. Biswas

Flat faces of steel pins were slid on an eutectic aluminium silicon alloy under lubricated condition in the 1–100MPa mean contact pressure range and 0.2m∕s sliding speed. Two transition in wear rate were observed, at 10MPa and 70MPa. The wear rate in the 1–10MPa regime was found to be very small and within the measuring instrument resolution and also insensitive to contact pressure. The regime is designated ultramild wear. Lack of plastic flow, minimal fragmentation of silicon particles, and the presence of undistorted voids on the fractured and unfractured silicon particles in the subsurface suggest that the state of stress in the near surface region is elastic. Contact mechanical calculations demonstrate that at contact pressures <13.7MPa, the system is likely to shakedown to an elastic state.


1988 ◽  
Vol 62 (01) ◽  
pp. 1-8 ◽  
Author(s):  
Ronald E. Martin

The utility of benthic foraminifera in bathymetric interpretation of clastic depositional environments is well established. In contrast, bathymetric distribution of benthic foraminifera in deep-water carbonate environments has been largely neglected. Approximately 260 species and morphotypes of benthic foraminifera were identified from 12 piston core tops and grab samples collected along two traverses 25 km apart across the northern windward margin of Little Bahama Bank at depths of 275-1,135 m. Certain species and operational taxonomic groups of benthic foraminifera correspond to major near-surface sedimentary facies of the windward margin of Little Bahama Bank and serve as reliable depth indicators. Globocassidulina subglobosa, Cibicides rugosus, and Cibicides wuellerstorfi are all reliable depth indicators, being most abundant at depths &gt;1,000 m, and are found in lower slope periplatform aprons, which are primarily comprised of sediment gravity flows. Reef-dwelling peneroplids and soritids (suborder Miliolina) and rotaliines (suborder Rotaliina) are most abundant at depths &lt;300 m, reflecting downslope bottom transport in proximity to bank-margin reefs. Small miliolines, rosalinids, and discorbids are abundant in periplatform ooze at depths &lt;300 m and are winnowed from the carbonate platform. Increased variation in assemblage diversity below 900 m reflects mixing of shallow- and deep-water species by sediment gravity flows.


Author(s):  
P.M. Rice ◽  
MJ. Kim ◽  
R.W. Carpenter

Extrinsic gettering of Cu on near-surface dislocations in Si has been the topic of recent investigation. It was shown that the Cu precipitated hetergeneously on dislocations as Cu silicide along with voids, and also with a secondary planar precipitate of unknown composition. Here we report the results of investigations of the sense of the strain fields about the large (~100 nm) silicide precipitates, and further analysis of the small (~10-20 nm) planar precipitates.Numerous dark field images were analyzed in accordance with Ashby and Brown's criteria for determining the sense of the strain fields about precipitates. While the situation is complicated by the presence of dislocations and secondary precipitates, micrographs like those shown in Fig. 1(a) and 1(b) tend to show anomalously wide strain fields with the dark side on the side of negative g, indicating the strain fields about the silicide precipitates are vacancy in nature. This is in conflict with information reported on the η'' phase (the Cu silicide phase presumed to precipitate within the bulk) whose interstitial strain field is considered responsible for the interstitial Si atoms which cause the bounding dislocation to expand during star colony growth.


Author(s):  
Naresh N. Thadhani ◽  
Thad Vreeland ◽  
Thomas J. Ahrens

A spherically-shaped, microcrystalline Ni-Ti alloy powder having fairly nonhomogeneous particle size distribution and chemical composition was consolidated with shock input energy of 316 kJ/kg. In the process of consolidation, shock energy is preferentially input at particle surfaces, resulting in melting of near-surface material and interparticle welding. The Ni-Ti powder particles were 2-60 μm in diameter (Fig. 1). About 30-40% of the powder particles were Ni-65wt% and balance were Ni-45wt%Ti (estimated by EMPA).Upon shock compaction, the two phase Ni-Ti powder particles were bonded together by the interparticle melt which rapidly solidified, usually to amorphous material. Fig. 2 is an optical micrograph (in plane of shock) of the consolidated Ni-Ti alloy powder, showing the particles with different etching contrast.


Author(s):  
R.C. Dickenson ◽  
K.R. Lawless

In thermal oxidation studies, the structure of the oxide-metal interface and the near-surface region is of great importance. A technique has been developed for constructing cross-sectional samples of oxidized aluminum alloys, which reveal these regions. The specimen preparation procedure is as follows: An ultra-sonic drill is used to cut a 3mm diameter disc from a 1.0mm thick sheet of the material. The disc is mounted on a brass block with low-melting wax, and a 1.0mm hole is drilled in the disc using a #60 drill bit. The drill is positioned so that the edge of the hole is tangent to the center of the disc (Fig. 1) . The disc is removed from the mount and cleaned with acetone to remove any traces of wax. To remove the cold-worked layer from the surface of the hole, the disc is placed in a standard sample holder for a Tenupol electropolisher so that the hole is in the center of the area to be polished.


Author(s):  
S. H. Chen

Sn has been used extensively as an n-type dopant in GaAs grown by molecular-beam epitaxy (MBE). The surface accumulation of Sn during the growth of Sn-doped GaAs has been observed by several investigators. It is still not clear whether the accumulation of Sn is a kinetically hindered process, as proposed first by Wood and Joyce, or surface segregation due to thermodynamic factors. The proposed donor-incorporation mechanisms were based on experimental results from such techniques as secondary ion mass spectrometry, Auger electron spectroscopy, and C-V measurements. In the present study, electron microscopy was used in combination with cross-section specimen preparation. The information on the morphology and microstructure of the surface accumulation can be obtained in a fine scale and may confirm several suggestions from indirect experimental evidence in the previous studies.


Author(s):  
K. F. Russell ◽  
L. L. Horton

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.


Author(s):  
Julia T. Luck ◽  
C. W. Boggs ◽  
S. J. Pennycook

The use of cross-sectional Transmission Electron Microscopy (TEM) has become invaluable for the characterization of the near-surface regions of semiconductors following ion-implantation and/or transient thermal processing. A fast and reliable technique is required which produces a large thin region while preserving the original sample surface. New analytical techniques, particularly the direct imaging of dopant distributions, also require good thickness uniformity. Two methods of ion milling are commonly used, and are compared below. The older method involves milling with a single gun from each side in turn, whereas a newer method uses two guns to mill from both sides simultaneously.


Author(s):  
A. T. Fisher ◽  
P. Angelini

Analytical electron microscopy (AEM) of the near surface microstructure of ion implanted ceramics can provide much information about these materials. Backthinning of specimens results in relatively large thin areas for analysis of precipitates, voids, dislocations, depth profiles of implanted species and other features. One of the most critical stages in the backthinning process is the ion milling procedure. Material sputtered during ion milling can redeposit on the back surface thereby contaminating the specimen with impurities such as Fe, Cr, Ni, Mo, Si, etc. These impurities may originate from the specimen, specimen platform and clamping plates, vacuum system, and other components. The contamination may take the form of discrete particles or continuous films [Fig. 1] and compromises many of the compositional and microstructural analyses. A method is being developed to protect the implanted surface by coating it with NaCl prior to backthinning. Impurities which deposit on the continuous NaCl film during ion milling are removed by immersing the specimen in water and floating the contaminants from the specimen as the salt dissolves.


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