Ellipsometric study of silicon surface damage in electron cyclotron resonance plasma etching using CF4and SF6
1991 ◽
Vol 30
(Part 1, No. 5)
◽
pp. 1045-1049
◽
2002 ◽
Vol 31
(7)
◽
pp. 749-753
◽
2017 ◽
Vol 35
(6)
◽
pp. 061303
◽
1996 ◽
Vol 14
(5)
◽
pp. 2827-2834
◽