Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

2006 ◽  
Vol 99 (2) ◽  
pp. 023523 ◽  
Author(s):  
G. Brauer ◽  
W. Anwand ◽  
W. Skorupa ◽  
S. Brandstetter ◽  
C. Teichert
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Implantation ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force

Characterization of H-Plasma Treated ZnO Crystals by Positron Annihilation and Atomic Force Microscopy

2012 ◽  
Vol 331 ◽  
pp. 113-125 ◽  
Author(s):  
Jakub Čížek ◽  
I. Procházka ◽  
J. Kuriplach ◽  
W. Anwand ◽  
Gerhard Brauer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Positron Annihilation ◽  
Crystal Surface ◽  
Photon Momentum ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Positron Lifetime Spectroscopy ◽  
Complementary Techniques

Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H-plasma. Defect characterization has been made by two complementary techniques of positron annihilation: positron lifetime spectroscopy and coincidence Doppler broadening. The high-momentum parts of the annihilation photon momentum distribution have been calculated from first principles in order to assist in defect identification. The positron annihilation results are supplemented by Atomic Force Microscopy for characterization of the crystal surface. It was found that virgin ZnO crystal contains Zn-vacancies associated with hydrogen. H-plasma treatment causes a significant reduction in concentration of these complexes. Physical mechanism of this effect is discussed in the paper.

scholarly journals Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

2014 ◽  
Vol 32 (3) ◽  
pp. 391-395 ◽  
Author(s):  
Ivan Karbovnyk ◽  
Ivan Bolesta ◽  
Ivan Rovetskii ◽  
Sergiy Velgosh ◽  
Halyna Klym
Keyword(s):  
Atomic Force Microscopy ◽  
Positron Annihilation ◽  
Formation Mechanism ◽  
Morphological Study ◽  
Positron Annihilation Spectroscopy ◽  
Optical Methods ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layered Crystals ◽  
Spectroscopy Studies

AbstractResults of the comprehensive morphological study of CdI2-BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the possible pores formation mechanism is proposed and validated by the results of luminescence measurements at 8 K.

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy

Micron ◽  
2011 ◽  
Vol 42 (3) ◽  
pp. 299-304 ◽  
Author(s):  
Gi-Ja Lee ◽  
Su-Jin Chae ◽  
Jae Hoon Jeong ◽  
So-Ra Lee ◽  
Sang-Jin Ha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Batch-Microfabricated Scanning Electrochemical-Atomic Force Microscopy Probes

2005 ◽  
Vol 77 (2) ◽  
pp. 424-434 ◽  
Author(s):  
Phillip S. Dobson ◽  
John M. R. Weaver ◽  
Mark N. Holder ◽  
Patrick R. Unwin ◽  
Julie V. Macpherson
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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