Developments in Using Scanning Probe Microscopy To Study Molecules on Surfaces — From Thin Films and Single-Molecule Conductivity to Drug–Living Cell Interactions

2006 ◽  
Vol 59 (6) ◽  
pp. 359 ◽  
Author(s):  
Pall Thordarson ◽  
Rob Atkin ◽  
Wouter H. J. Kalle ◽  
Gregory G. Warr ◽  
Filip Braet
Keyword(s):  
Single Molecule ◽  
Scanning Probe Microscopy ◽  
Cell Interactions ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tunnelling Microscopy ◽  
Molecule Surface

Scanning probe microscopy (SPM) techniques, including atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), have revolutionized our understanding of molecule–surface interactions. The high resolution and versatility of SPM techniques have helped elucidate the morphology of adsorbed surfactant layers, facilitated the study of electronically conductive single molecules and biomolecules connected to metal substrates, and allowed direct observation of real-time processes such as in situ DNA hybridization and drug–cell interactions. These examples illustrate the power that SPM possesses to study (bio)molecules on surfaces and will be discussed in depth in this review.

scholarly journals Micro-Area Ferroelectric, Piezoelectric and Conductive Properties of Single BiFeO3 Nanowire by Scanning Probe Microscopy

Nanomaterials ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 190 ◽  
Author(s):  
Shenglan Wu ◽  
Jing Zhang ◽  
Xiaoyan Liu ◽  
Siyi Lv ◽  
Rongli Gao ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Bismuth Ferrite ◽  
Piezoresponse Force Microscopy ◽  
Scanning Probe ◽  
Switching Behavior ◽  
X Ray Diffraction ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Conductive Properties

Ferroelectric nanowires have attracted great attention due to their excellent physical properties. We report the domain structure, ferroelectric, piezoelectric, and conductive properties of bismuth ferrite (BFO, short for BiFeO3) nanowires characterized by scanning probe microscopy (SPM). The X-ray diffraction (XRD) pattern presents single phase BFO without other obvious impurities. The piezoresponse force microscopy (PFM) results indicate that the nanowires possess a multidomain configuration, and the maximum piezoelectric coefficient (d33) of single BFO nanowire is 22.21 pm/V. Poling experiments and local switching spectroscopy piezoresponse force microscopy (SS-PFM) demonstrate that there is sufficient polarization switching behavior and obvious piezoelectric properties in BFO nanowires. The conducting atomic force microscopy (C-AFM) results show that the current is just hundreds of pA at 8 V. These lay the foundation for the application of BFO nanowires in nanodevices.

In Situ Electrochemical Scanning Probe Microscopy of Lithium Battery Cathode Materials: Vanadium Pentoxide (V2O5)

2002 ◽  
Vol 756 ◽  
Author(s):  
Joseph W. Bullard ◽  
Richard L. Smith
Keyword(s):  
Scanning Probe Microscopy ◽  
Lithium Battery ◽  
Structural Evolution ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Cycling ◽  
Pit Nucleation

ABSTRACTAtomic force microscopy was used to characterize the structural evolution of the V2O5(001) surface during the electrochemical cycling of lithium. With Li insertion, nanometer-scale pits develop at the V2O5(001) surface. The pits first appear as the composition of the crystal approaches Li0.0006V2O5. Pit nucleation and growth continue through further discharge, resulting in a micro-porous (001) surface morphology. During subsequent Li extraction, cracks develop along the V2O5 <010> axis. Surface regions in the vicinity of these cracks “swell” during ensuing lithiation reactions, suggesting that the cracks locally facilitate Li uptake.

scholarly journals Microscopia de varredura por sonda (SPM) aplicada a aços inoxidáveis dúplex

2007 ◽  
Vol 60 (1) ◽  
pp. 183-187
Author(s):  
Fabricio Simão dos Santos ◽  
Simoni Maria Gheno ◽  
Sebastião Elias Kuri
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Nesse trabalho, a microscopia de varredura por sonda (Scanning Probe Microscopy - SPM), nos modos contato (Atomic Force Microscopy - AFM) e de força magnética (Magnetic Force Microscopy - MFM), foi utilizada para analisar a microestrutura de um aço inoxidável dúplex 2205 solubilizado e envelhecido. Foi feita uma análise por AFM da superfície do aço solubilizado após crescimento de filme passivo. Por AFM, obteve-se indicação de crescimento de filme sobre a microestrutura do aço solubilizado, enquanto por MFM a distribuição de fases pôde ser observada sem a necessidade de ataque da superfície.

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