Ti–Ar scattering cross sections by direct comparison of Monte Carlo simulations and laser-induced fluorescence spectroscopy in magnetron discharges

2013 ◽  
Vol 46 (17) ◽  
pp. 175201 ◽  
Author(s):  
Daniel Lundin ◽  
Catalin Vitelaru ◽  
Ludovic de Poucques ◽  
Nils Brenning ◽  
Tiberiu Minea
2021 ◽  
Vol 75 (12) ◽  
Author(s):  
A. García-Abenza ◽  
A. I. Lozano ◽  
L. Álvarez ◽  
J. C. Oller ◽  
F. Blanco ◽  
...  

Abstract A self-consistent data set, with all the necessary inputs for Monte Carlo simulations of electron transport through gaseous tetrahydrofuran (THF) in the energy range 1–100 eV, has been critically compiled in this study. Accurate measurements of total electron scattering cross sections (TCSs) from THF have been obtained, and considered as reference values to validate the self-consistency of the proposed data set. Monte Carlo simulations of the magnetically confined electron transport through a gas cell containing THF for different beam energies (3, 10 and 70 eV) and pressures (2.5 and 5.0 mTorr) have also been performed by using a novel code developed in Madrid. In order to probe the accuracy of the proposed data set, the simulated results have been compared with the corresponding experimental data, the latter obtained with the same experimental configuration where the TCSs have been measured. Graphic Abstract


Author(s):  
T.D. Ly ◽  
D.G Howitt

The calculation of image contrast in heterogeneous samples can be done using Monte Carlo techniques if the electron trajectories can be calculated through the composition profiles in the specimen. Most of the programs that are available are designed to calculate signal intensities from samples of uniform atomic number and density (e.g Joy 1988, Reimer and Steltzer 1987) but some success has been achieved in the description of samples with distinct composition profiles by extrapolating these results.The image simulations we have done here are based upon Monte Carlo calculations of the electron backscattered signal from samples where the composition variations can be taken into account in determining both the elastic and inelastic scattering cross sections. This work involved extending the program developed by Joy (1988) and comparing the calculated signal intensities to the values derived experimentally from a specimen of well defined geometry. In the program the elastic scattering cross-sections, which describe the collisions of the electrons with the atomic nucleus are described by a Rutherford model given by(1)


Author(s):  
P.A. Crozier

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.


2020 ◽  
Vol 102 (11) ◽  
Author(s):  
Hidenori Fukaya ◽  
Shoji Hashimoto ◽  
Takashi Kaneko ◽  
Hiroshi Ohki

2021 ◽  
Vol 27 (S1) ◽  
pp. 600-602
Author(s):  
Zezhong Zhang ◽  
Annick De Backer ◽  
Ivan Lobato ◽  
Sandra Van Aert ◽  
Peter Nellist

Sign in / Sign up

Export Citation Format

Share Document