Study on image reconstruction of capacitively coupled electrical impedance tomography (CCEIT)

2019 ◽  
Vol 30 (9) ◽  
pp. 094002 ◽  
Author(s):  
Yuxin Wang ◽  
Haifeng Ji ◽  
Zhiyao Huang ◽  
Baoliang Wang ◽  
Haiqing Li
Sensor Review ◽  
2017 ◽  
Vol 37 (3) ◽  
pp. 257-269 ◽  
Author(s):  
Qi Wang ◽  
Pengcheng Zhang ◽  
Jianming Wang ◽  
Qingliang Chen ◽  
Zhijie Lian ◽  
...  

Purpose Electrical impedance tomography (EIT) is a technique for reconstructing the conductivity distribution by injecting currents at the boundary of a subject and measuring the resulting changes in voltage. Image reconstruction for EIT is a nonlinear problem. A generalized inverse operator is usually ill-posed and ill-conditioned. Therefore, the solutions for EIT are not unique and highly sensitive to the measurement noise. Design/methodology/approach This paper develops a novel image reconstruction algorithm for EIT based on patch-based sparse representation. The sparsifying dictionary optimization and image reconstruction are performed alternately. Two patch-based sparsity, namely, square-patch sparsity and column-patch sparsity, are discussed and compared with the global sparsity. Findings Both simulation and experimental results indicate that the patch based sparsity method can improve the quality of image reconstruction and tolerate a relatively high level of noise in the measured voltages. Originality/value EIT image is reconstructed based on patch-based sparse representation. Square-patch sparsity and column-patch sparsity are proposed and compared. Sparse dictionary optimization and image reconstruction are performed alternately. The new method tolerates a relatively high level of noise in measured voltages.


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