Data Acquisition and Baseband Analysis Techniques of the HP 3048A Phase Noise Measurement System

1987 ◽  
Author(s):  
Greg Nalder
Keyword(s):  
Data Acquisition ◽  
Phase Noise ◽  
Measurement System ◽  
Noise Measurement ◽  
Analysis Techniques

Phase-Noise Measurement System for the Terahertz-Band

2012 ◽  
Vol 2 (6) ◽  
pp. 638-641
Author(s):  
J. A. DeSalvo ◽  
A. Hati ◽  
C. Nelson ◽  
D. A. Howe
Keyword(s):  
Phase Noise ◽  
Measurement System ◽  
Noise Measurement ◽  
Terahertz Band

Optoectronic phase noise measurement system with wideband analysis

2012 ◽  
Author(s):  
Patrice Salzenstein ◽  
Abdelhamid Hmima ◽  
Mikhail Zarubin ◽  
Ekaterina Pavlyuchenko ◽  
Nathalie Cholley
Keyword(s):  
Phase Noise ◽  
Measurement System ◽  
Noise Measurement

Flicker Noise in Opto-Electronic Oscillator and Photonic-Delay Homodyne Phase Noise Measurement System

2015 ◽  
Vol 719-720 ◽  
pp. 869-874
Author(s):  
Zu Lin Li ◽  
Yuan Yao ◽  
Jun Hong
Keyword(s):  
White Noise ◽  
Phase Noise ◽  
Measurement System ◽  
Flicker Noise ◽  
Theory Model ◽  
Analytic Theory ◽  
Noise Measurement ◽  
Noise Amplifier ◽  
Low Phase Noise ◽  
Electronic Oscillator

In this paper, the effect of device flicker noise on the characteristics of both opto-electronic oscillator and Photonic-delay homodyne phase noise measurement system is analyzed. An analytic theory model of opto-electronic oscillator (OEO) is derived and verified by experiments in this paper, where the flicker and white noise are both considered. The sensitivity of Photonic-delay homodyne phase noise measurement system is improved by using high-linear photodetector and low-phase noise amplifier resulting from decreasing systematic phase noise.

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