Multi-port Reflectometry Applied to a Varactor-Tuned Sampled-Line

2020 95th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg47271.2020.9241371 ◽

2020 ◽

Author(s):

Devon T. Donahue ◽

Taylor W. Barton

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