Effect of RTL coding style on testability

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169) ◽

10.1109/cicc.2001.929767 ◽

2002 ◽

Author(s):

Yu Huang ◽

Chien-Chung Tsai ◽

N. Mukherhee ◽

Wu-Tung Cheng ◽

S.M. Reddy

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