An Investigation of the Effect of Different Number of Electrodes on EIT Reconstructed Images

2020 IEEE 2nd International Conference on Artificial Intelligence in Engineering and Technology (IICAIET) ◽

10.1109/iicaiet49801.2020.9257848 ◽

2020 ◽

Author(s):

Yew Lek Chong ◽

Renee Ka Yin Chin

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