Non-intrusive built-in test for 65nm RF LNA

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997397 ◽

2014 ◽

Author(s):

Athanasios Dimakos ◽

Haralampos-G. Stratigopoulos ◽

Alexandre Siligaris ◽

Salvador Mir ◽

Emeric De Foucauld

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