Effect-cause intra-cell diagnosis at transistor level

International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2013.6523652 ◽

2013 ◽

Author(s):

Zhenzhou Sun ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

A. Todri ◽

...

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