SiC MOSFET robustness to ESD study: Correlation between electrical and spectral photo-emission characterizations

2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON) ◽

10.1109/melcon.2018.8379104 ◽

2018 ◽

Author(s):

Niemat Moultif ◽

Eric Joubert ◽

Olivier Latry

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