Properties of complex parameters of five-port reflectometer with E-plane oblique X- and T-junctions

2014 International Conference on Mathematical Methods in Electromagnetic Theory ◽

10.1109/mmet.2014.6928757 ◽

2014 ◽

Author(s):

V.A. Karlov ◽

M.V. Andreev ◽

V. F. Borulko

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