Minority Carrier Lifetime Variations in Multicrystalline Silicon Wafers with Temperature and Ingot Position

Author(s):  
Sissel Tind Sondergaard ◽  
Jan Ove Odden ◽  
Rune Strandberg
2013 ◽  
Vol 440 ◽  
pp. 82-87 ◽  
Author(s):  
Mohammad Jahangir Alam ◽  
Mohammad Ziaur Rahman

A comparative study has been made to analyze the impact of interstitial iron in minority carrier lifetime of multicrystalline silicon (mc-Si). It is shown that iron plays a negative role and is considered very detrimental for minority carrier recombination lifetime. The analytical results of this study are aligned with the spatially resolved imaging analysis of iron rich mc-Si.


2002 ◽  
Vol 73 (2) ◽  
pp. 125-130 ◽  
Author(s):  
J. Härkönen ◽  
V-P. Lempinen ◽  
T. Juvonen ◽  
J. Kylmäluoma

1999 ◽  
Vol 70 (10) ◽  
pp. 4044-4046 ◽  
Author(s):  
J. Gervais ◽  
O. Palais ◽  
L. Clerc ◽  
S. Martinuzzi

2010 ◽  
Vol 97 (9) ◽  
pp. 092109 ◽  
Author(s):  
J. A. Giesecke ◽  
M. C. Schubert ◽  
D. Walter ◽  
W. Warta

Sign in / Sign up

Export Citation Format

Share Document