A Novel Digital Etch Technique for p-GaN Gate HEMT

2018 IEEE International Conference on Semiconductor Electronics (ICSE) ◽

10.1109/smelec.2018.8481283 ◽

2018 ◽

Author(s):

Yuan Lin ◽

Yueh Chin Lin ◽

Franky Lumbantoruan ◽

Chang Fu Dec ◽

Burhanuddin Yeop Majilis ◽

...

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