Single Event Burnout Hardening Technique for High-Voltage p-i-n Diodes With Field Limiting Rings Termination Structure
2018 ◽
Vol 65
(1)
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pp. 256-261
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Keyword(s):
1997 ◽
Vol 44
(6)
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pp. 2358-2366
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Keyword(s):
2020 ◽
Vol 67
(1)
◽
pp. 22-28
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