scholarly journals Measurement of Electron Mobility-Lifetime Product in 3-D Position-Sensitive CdZnTe Detectors Using the VAD_UMv2.2 Digital Readout System

2018 ◽  
Vol 65 (11) ◽  
pp. 2834-2837 ◽  
Author(s):  
Jiawei Xia ◽  
Michael Streicher ◽  
Yuefeng Zhu ◽  
Zhong He
2012 ◽  
Vol 59 (1) ◽  
pp. 236-242 ◽  
Author(s):  
Feng Zhang ◽  
Cedric Herman ◽  
Zhong He ◽  
Gianluigi De Geronimo ◽  
Emerson Vernon ◽  
...  

2017 ◽  
Vol 64 (10) ◽  
pp. 2698-2705 ◽  
Author(s):  
L. A. Ocampo Giraldo ◽  
A. E. Bolotnikov ◽  
G. S. Camarda ◽  
S. Cheng ◽  
G. De Geronimo ◽  
...  

1999 ◽  
Author(s):  
Yanfeng Du ◽  
Zhong He ◽  
Glenn F. Knoll ◽  
David K. Wehe ◽  
Weiqi Li

2006 ◽  
Vol 1 (1) ◽  
pp. 106-110 ◽  
Author(s):  
Bin Zhou ◽  
Zhong-yu Gao ◽  
Huai Chen ◽  
Rong Zhang ◽  
Zhi-yong Chen

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