Measurement of Electron Mobility-Lifetime Product in 3-D Position-Sensitive CdZnTe Detectors Using the VAD_UMv2.2 Digital Readout System
2018 ◽
Vol 65
(11)
◽
pp. 2834-2837
◽
Jiawei Xia
◽
Michael Streicher
◽
Yuefeng Zhu
◽
Zhong He
2012 ◽
Vol 59
(1)
◽
pp. 236-242
◽
Feng Zhang
◽
Cedric Herman
◽
Zhong He
◽
Gianluigi De Geronimo
◽
Emerson Vernon
◽
...
C. Baxter
◽
T. Chandler
◽
N. Dressnandt
◽
C. Gay
◽
B. Lundberg
◽
...
Bennett Williams
◽
Zhong He
2020 ◽
Vol 954
◽
pp. 161339
◽
David Goodman
◽
Jiawei Xia
◽
Jeff Sanders
◽
Zhong He
2017 ◽
Vol 64
(10)
◽
pp. 2698-2705
◽
L. A. Ocampo Giraldo
◽
A. E. Bolotnikov
◽
G. S. Camarda
◽
S. Cheng
◽
G. De Geronimo
◽
...
Yanfeng Du
◽
Zhong He
◽
Glenn F. Knoll
◽
David K. Wehe
◽
Weiqi Li
2006 ◽
Vol 1
(1)
◽
pp. 106-110
◽
Bin Zhou
◽
Zhong-yu Gao
◽
Huai Chen
◽
Rong Zhang
◽
Zhi-yong Chen
1997 ◽
Vol 392
(1-3)
◽
pp. 392-395
◽
F Arfelli
◽
G Barbiellini
◽
V Bonvicini
◽
A Bravin
◽
G Cantatore
◽
...
Aleksey E. Bolotnikov
◽
Giuseppe Camarda
◽
Gianluigi De Geronimo
◽
Jack Fried
◽
Deidra Hodges
◽
...
Yanfeng Du
◽
Zhong He
◽
G.F. Knoll
◽
D.K. Wehe
◽
Wen Li
◽
...