Second-Order Ultrasound Elastography with L1-norm Spatial Regularization

Abstract Absolute acoustic impedance (AI) is generally divided into background AI and relative AI for linear inversion. In practice, the intermediate frequency components of the AI model are generally poorly reconstructed, so the estimated AI will suffer from an error caused by the frequency gap. To remedy this error, a priori information should be incorporated to narrow down the gap. With the knowledge that underground reflectivity was sparse, we solved an L1 norm constrained problem to extend the bandwidth of the reflectivity section, and an absolute AI model was then estimated with broadband reflectivity section and given background AI. Conventionally, the AI model is regularized with the total variation (TV) norm because of its blocky feature. However, the first-order TV norm that leads to piecewise-constant solutions will cause staircase errors in slanted and smooth regions in the inverted AI model. To better restore the smooth variation while preserving the sharp geological structure of the AI model, we introduced a second-order extension of the first-order TV norm and inverted the absolute AI model with combined first- and second-order TV regularizations. The algorithm used to solve the optimization problem with the combined TV constraints was derived based on split-Bregman iterations. Numerical experiments that were tested on the Marmousi AI model and 2D stacked field data illustrated the effectiveness of the sparse constraint with respect to shrinking the frequency gaps and proved that the proposed combined TV norms had better performances than those with conventional first-order TV norms.

Download Full-text

Disappearance Voltage Determinations Using a Convergent Beam

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064979 ◽

1971 ◽

Vol 29 ◽

pp. 184-185

Author(s):

W. L. Bell

Keyword(s):

Second Order ◽

Objective Method ◽

Uniform Thickness ◽

Rocking Curve ◽

Crystal Perfection ◽

Kikuchi Line ◽

Central Maximum ◽

Diffraction Patterns ◽

Convergent Beam ◽

Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Download Full-text