Variability characterisation of nanoscale Si and InGaAs FinFETs at subthreshold

2014 5th European Workshop on CMOS Variability (VARI) ◽

10.1109/vari.2014.6957085 ◽

2014 ◽

Author(s):

G. Indalecio ◽

N. Seoane ◽

M. Aldegunde ◽

K. Kalna ◽

A. J. Garcia-Loureiro

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