Layer-by-Layer Analysis of the Thickness Distribution of Silicon Dioxide in the Structure SiO2/Si(111) by Inelastic Electron Scattering Cross-Section Spectroscopy
2019 ◽
Vol 467
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pp. 012010
2019 ◽
Vol 20
(1)
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pp. 99-105
2011 ◽
Vol 43
(12)
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pp. 1514-1526
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2020 ◽
Vol 822
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pp. 012026
2016 ◽
Vol 122
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pp. 012025
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