High Resolution Z-Contrast Observation of GaAs/Si Hetero-Interfaces through Scanning Transmission Electron Microscope

1992 ◽  
Vol 31 (Part 2, No. 12B) ◽  
pp. L1788-L1790 ◽  
Author(s):  
Eiryo Takasuka ◽  
Koyu Asai ◽  
Kazuhisa Fujita ◽  
Matthew F. Chisholm ◽  
Stephen J. Pennycook
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Z Contrast

Unique Features of a High Resolution Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 404-405
Author(s):  
J. W. Wiggins ◽  
M. Beer ◽  
D. C. Woodruff ◽  
J. A. Zubin
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Heavy Atom ◽  
Scanning Transmission Electron Microscope ◽  
Objective Lens ◽  
Optical Parameters ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

A high resolution scanning transmission electron microscope has been constructed and is operating. The initial task of this instrument is to attempt the sequencing of DNA by heavy-atom specific staining. It is also suitable for many other biological investigations requiring high resolution, low contamination and minimum radiation damage.The basic optical parameters are: 20 to 100 KV acceleration potential, objective lens focal length of 1.0 mm. with Cs = 0.7 mm., and two additional lenses designated as condensor and diffraction lenses. The purpose of the condensor lens is to provide a parallel beam incident to the objective, and the diffraction lens produces an image of the back focal plane of the objective in the plane of an annular detector.

scholarly journals High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope

2010 ◽  
Vol 16 (S2) ◽  
pp. 102-103
Author(s):  
H Inada ◽  
M Konno ◽  
Y Suzuki ◽  
K Nakamura ◽  
J Wall ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Secondary Electron ◽  
Scanning Transmission Electron Microscope ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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