Surface Potential Measurement of Carbon Nanotube Field-Effect Transistors Using Kelvin Probe Force Microscopy

2007 ◽  
Vol 46 (4B) ◽  
pp. 2496-2500 ◽  
Author(s):  
Takeo Umesaka ◽  
Hirofumi Ohnaka ◽  
Yutaka Ohno ◽  
Shigeru Kishimoto ◽  
Koichi Maezawa ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Surface Potential ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

POTENTIAL PROFILE MEASUREMENT OF CARBON NANOTUBE FETs BASED ON THE ELECTROSTATIC FORCE DETECTION

NANO ◽  
2008 ◽  
Vol 03 (01) ◽  
pp. 51-54 ◽  
Author(s):  
YUKI OKIGAWA ◽  
TAKEO UMESAKA ◽  
YUTAKA OHNO ◽  
SHIGERU KISHIMOTO ◽  
TAKASHI MIZUTANI
Keyword(s):  
Carbon Nanotube ◽  
Field Effect ◽  
Potential Distribution ◽  
Field Effect Transistors ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Profile Measurement ◽  
Kelvin Probe ◽  
Force Detection ◽  
Force Microscopy

We have measured the potential distribution on carbon nanotube (CNT) field-effect transistors (FETs) using electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KFM). Clearer potential profiles were obtained by EFM than by KFM. When the CNT-FET is in the ON state, the EFM image shows uniform potential distribution along the CNT. In contrast, when the CNT-FET is in the OFF state, nonuniform potential image with dark spots are obtained. The dark spots can be attributed to the defects in the CNTs.

Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4381-4383 ◽  
Author(s):  
Keiichi Umeda ◽  
Kei Kobayashi ◽  
Kenji Ishida ◽  
Shu Hotta ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Contact Potential Measurement of Carbon Nanotube by Kelvin Probe Force Microscopy

2003 ◽  
Vol 42 (Part 1, No. 4B) ◽  
pp. 2449-2452 ◽  
Author(s):  
Chikashi Maeda ◽  
Shigeru Kishimoto ◽  
Takasi Mizutani ◽  
Toshiki Sugai ◽  
Hisanori Shinohara
Keyword(s):  
Carbon Nanotube ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Potential Measurement ◽  
Force Microscopy
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