Extracting redundancy-aware top-k patterns

Proceedings of the 12th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '06 ◽

10.1145/1150402.1150452 ◽

2006 ◽

Author(s):

Dong Xin ◽

Hong Cheng ◽

Xifeng Yan ◽

Jiawei Han

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