Test patterns for IoT

Proceedings of the 9th ACM SIGSOFT International Workshop on Automating TEST Case Design, Selection, and Evaluation - A-TEST 2018 ◽

10.1145/3278186.3278196 ◽

2018 ◽

Author(s):

Pedro Martins Pontes ◽

Bruno Lima ◽

João Pascoal Faria

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