Characterisation of the surface morphology and electronic structure of YBa2Cu3O7-x thin films by atomic force and scanning tunneling microscopies

2022 ◽  
pp. 209-212
Author(s):  
A G Fitzgerald ◽  
Y C Fan ◽  
H C Xu ◽  
C W An ◽  
B Su ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Structure ◽  
Surface Morphology ◽  
Scanning Tunneling ◽  
Atomic Force

Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Pyrolytic Graphite ◽  
Film Surface ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Investigation

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

The Surface Morphology and Characterisation of Electronic Properties of Boron Implanted Microwave Plasma CVD Diamond Films by Atomic Force and Scanning Tunneling Microscopies

1998 ◽  
Vol 4 (S2) ◽  
pp. 332-333
Author(s):  
A. G. Fitzgerald ◽  
Y. Fan ◽  
P. John ◽  
C. E. Troupe ◽  
J. I. B. Wilson
Keyword(s):  
Surface Morphology ◽  
Electronic Properties ◽  
Microwave Plasma ◽  
Diamond Films ◽  
High Energy ◽  
Scanning Tunneling Spectroscopy ◽  
Morphological Features ◽  
Scanning Tunneling ◽  
Crystal Surfaces ◽  
Atomic Force

The surface morphology and electronic properties of a low energy boron implanted diamond films with shallow doping, prepared by microwave plasma enhanced chemical vapour deposition (CVD), have been characterised by atomic force microscopy (AFM), scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) techniques.Both AFM and STM images taken at different locations on the films have exhibited similar morphological features on the (100) crystal surfaces. The crystal surfaces are not atomically flat but are composed of many hillocks as shown in Fig 1(a) to 1(c). The majority of values measured from the peaks of hillocks to the valleys are in the range of 2 to 5 nm, and the diameter of these hillocks is in the range of 50 to 250 nanometers. These crystal surface morphological features are believed to be caused in the high energy boron ion implantation process.

Biocompatibility Studies of the Nitinol Thin Films

2003 ◽  
Vol 780 ◽  
Author(s):  
C.Z. Dinu ◽  
R. Tanasa ◽  
V.C. Dinca ◽  
A. Barbalat ◽  
C. Grigoriu ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Fibroblast Cell ◽  
Vero Cells ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fetal Bovine ◽  
Fibroblast Cell Lines

AbstractPulsed Laser Deposition method (PLD) was used to grow nitinol (NiTi) thin films with goal of investigating their biocompatibility. High purity Ni and Ti targets were alternatively ablated in vacuum with a laser beam (λ=355 nm, 10 Hz) and the material was collected on room temperature Ti substrates. X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy and atomic force microscopy analyses have been performed to investigate the chemical composition, crystalline structure and surface morphology of the NiTi films. The nitinol layers biocompatibility has been tested using as a metric the extent to whichthe cells adhereduring the culture period on the surface of NiTi layers deposited on Ti substrates. Vero and fibroblast cell lines dispersed into MEM (Eagle) solution containing 8% fetal bovine serum, at 37° C, were used for tests. Preliminary studies indicate that the interaction at the interface is specifically controlled by the surface morphology, (especially by surface roughness), and by the chemical state of the surface. Cell behavior after contact with NiTi/Ti structure for different intervals (18, 22 and 25 days for the Vero cells, and after 10 and 25 days for fibroblasts) supports the conclusion that NiTi is a very good candidate as a biocompatible material.

scholarly journals Формирование упорядоченных кремниевых структур на поверхности графита

2019 ◽  
Vol 61 (8) ◽  
pp. 1532
Author(s):  
А.А. Ревегук ◽  
А.Е. Петухов ◽  
А.А. Вишнякова ◽  
А.В. Королева ◽  
Д.А. Пудиков ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electronic Structure ◽  
Surface Morphology ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Force Microscopy ◽  
Final Structure ◽  
Atomic Force ◽  
Silicon Structures

The work investigated the formation possibility of ordered silicon structures, including silicene, on the graphite substrates surface. The various conditions influence on the silicon atoms deposition on the final structure was also studied. Surface morphology information was obtained by atomic force microscopy, and the electronic structure was measured by Auger electron spectroscopy.

SURFACE MORPHOLOGY AND PHOTOLUMINESCENCE CHARACTERISTICS OF Sm-DOPED YVO4 THIN FILMS

2007 ◽  
Vol 14 (05) ◽  
pp. 873-878 ◽  
Author(s):  
HYUN KYOUNG YANG ◽  
JONG WON CHUNG ◽  
BYUNG KEE MOON ◽  
BYUNG CHUN CHOI ◽  
JUNG HYUN JUNG ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Substrate Temperature ◽  
Photoluminescence Intensity ◽  
Photoluminescence Spectra ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zircon Structure ◽  
Substrate Temperatures

Surface morphology and crystallinity of YVO 4: Sm 3+ thin films have an influence on the photoluminescence characteristics. The YVO 4: Sm 3+ films have been deposited on Al 2 O 3 (0001) substrates using pulsed laser deposition method. The films were grown at the various substrate temperatures changing from 500 to 700°C. The crystallinity and surface morphology of the films were investigated using X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. The results of XRD showed that YVO 4: Sm 3+ films had a zircon structure and AFM study revealed that the films consisted of homogeneous grains ranging from 100 to 400 nm depending on the deposition conditions. The photoluminescence spectra were measured at room temperature and the emitted radiation was dominated by the red emission peak at 620 nm radiated from the transition of 5 D 0-7 F 2. The crystallinity, surface morphology, and photoluminescence spectra of thin-film phosphors were highly dependent on the substrate temperature. The surface roughness and photoluminescence intensity of the films showed similar behavior as a function of substrate temperature.

Synthesis and Characterization of Amorphous Metallic Alloy Thin Films for MEMS Applications

2003 ◽  
Vol 806 ◽  
Author(s):  
Senthil N Sambandam ◽  
Shekhar Bhansali ◽  
Venkat R. Bhethanabotla
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Surface Morphology ◽  
X Ray Diffraction ◽  
Micro Electro Mechanical Systems ◽  
Force Microscopy ◽  
Target Composition ◽  
Atomic Force ◽  
Deposition Parameters ◽  
Afm Analysis

ABSTRACTMicrostructures of multi-component amorphous metallic glass alloys are becoming increasingly important due to their excellent mechanical properties and low coefficient of friction. In this work, thin films of Zr-Ti-Cu-Ni-Be have been deposited by DC magnetron sputtering in view of exploring their potential technological applications in fields such as Micro Electro Mechanical Systems (MEMS). Their structure, composition, surface morphology, mechanical properties viz., hardness and Young's modulus were analyzed using X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Nanoindentation. Influence of the deposition parameters of sputtering pressure and power upon the composition and surface morphology of these films has been evidenced by SEM, and AFM analysis, showing that such a process yields very smooth films with target composition at low sputtering pressures. These studies are useful in understanding the multicomponent sputtering process.

Surface morphology of YBa2Cu3O7−δ thin films on SrTiO3(100) studied by scanning tunneling microscopy

1993 ◽  
Vol 195 ◽  
pp. 97-100 ◽  
Author(s):  
H.P. Lang ◽  
R. Sum ◽  
H. Haefke ◽  
H.-J. Güntherodt
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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